ToF-SIMS imaging study of the early stages of corrosion in Al-Cu thin films

The pitting corrosion of Al-Cu thin film alloys was investigated using samples that were heat treated in air to form through-thickness Al₂Cu particles within an Al-0.5 Cu matrix. Time-of-Flight Secondary Ion Mass Spectroscopy (ToF-SIMS) analysis revealed Cu-rich regions 250-800 nm in lateral extent near the metal/oxide interface. Following exposure that generated pitting corrosion, secondary electron, secondary ion, and AFM images showed pits with size and density similar to those of the Cu-rich regions. The role of the Cu-rich regions is addressed.