Abstract
In this paper we report on the scintillation properties of TlSr2I5 doped with Eu2+, a novel thallium-containing high-resolution scintillator for gamma-ray spectroscopy. Small diameter, good quality crystals of TlSr2I5:Eu (TSI) with different Eu2+ concentrations were grown by the vertical Bridgman method. X-ray diffraction measurements show that single crystals of TSI belong to the monoclinic system with space group P21/c. TlSr2I5 has a density of 5.32 g/cm3 and effective Z of 60. The X-ray excited emission of Eu2+ doped TlSr2I5 features a broad emission band peaking between 460–470 nm. The light yield of TlSr2I5 crystal doped with 1% Eu2+ is measured to be ∼72,000 ph/MeV with an energy resolution of 2.8% at 662 keV. The scintillation decay time which is characteristic of Eu2+ shows two components, with ∼90% of the light in a ∼500 ns component and the rest in a longer component of ∼3 μs.
Original language | English |
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Article number | 164876 |
Journal | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment |
Volume | 988 |
DOIs | |
State | Published - Feb 1 2021 |
Externally published | Yes |
Funding
This manuscript has been co-authored by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy. The United States Government retains and the publisher, by accepting the article for publication, acknowledges that the United States Government retains a non-exclusive, paid-up, irrevocable, world-wide license to publish or reproduce the published form of this manuscript, or allow others to do so, for United States Government purposes. The Department of Energy will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).This work has been supported by the US Defense Threat Reduction Agency, under competitively awarded contract HDTRA1-16-1-0007. This support does not constitute an express or implied endorsement on the part of the Government. XRD was performed at the Joint Institute for Advanced Materials (JIAM) Diffraction Facility, located at the University of Tennessee, Knoxville. This material is based on work supported in part by the Department of Energy National Nuclear Security Administration through the Nuclear Science and Security Consortium under Award Number DE-NA-0003180. This report was prepared as an account of work sponsored by an agency of the United States Government. Neither the United States Government nor any agency thereof, nor any of their employees, makes any warranty, express or implied, or assumes any legal liability or responsibility for the accuracy, completeness, or usefulness of any information, apparatus, product, or process disclosed, or represents that its use would not infringe privately owned rights. Reference herein to any specific commercial product, process, or service by trade name, trademark, manufacturer, or otherwise does not necessarily constitute or imply its endorsement, recommendation, or favoring by the United States Government or any agency thereof. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.
Funders | Funder number |
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DOE Public Access Plan | |
United States Government | |
U.S. Department of Energy | |
Defense Threat Reduction Agency | HDTRA1-16-1-0007 |
National Nuclear Security Administration | DE-NA-0003180 |
University of Tennessee | |
UT-Battelle | DE-AC05-00OR22725 |
Keywords
- DFT calculations
- Gamma-ray spectroscopy
- Inorganic scintillators
- Thallium-based scintillators
- TlSrI
- X-ray diffraction