Time-resolved study of SrTiO3 homoepitaxial pulsed-laser deposition using surface x-ray diffraction

G. Eres; J. Z. Tischler; M. Yoon; B. C. Larson; C. M. Rouleau; D. H. Lowndes; P. Zschack

doi:10.1063/1.1477279

Time-resolved study of SrTiO₃ homoepitaxial pulsed-laser deposition using surface x-ray diffraction

G. Eres, J. Z. Tischler, M. Yoon, B. C. Larson, C. M. Rouleau, D. H. Lowndes, P. Zschack

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Abstract

Homoepitaxy of SrTiO₃ by pulsed-laser deposition has been studied using in situ time-resolved surface x-ray diffraction in the temperature range of 310°C to 780°C. Using a two-detector configuration, surface x-ray diffraction intensities were monitored simultaneously at the (0 0 1 2) specular and the (0 1 1 2) off-specular truncation rod positions. Abrupt intensity changes in both the specular and off-specular rods after laser pulses indicated prompt crystallization into SrTiO₃ layers followed by slower intra- and interlayer surface rearrangements on time scales of seconds. Specular rod intensity oscillations indicated layer-by-layer growth, while off-specular rod intensity measurements suggested the presence of transient in-plane lattice distortions for depositions above 600°C.

Original language	English
Pages (from-to)	3379-3381
Number of pages	3
Journal	Applied Physics Letters
Volume	80
Issue number	18
DOIs	https://doi.org/10.1063/1.1477279
State	Published - May 6 2002

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@article{582c963e0e2c4ff7b1480429fc9480b0,

title = "Time-resolved study of SrTiO3 homoepitaxial pulsed-laser deposition using surface x-ray diffraction",

abstract = "Homoepitaxy of SrTiO3 by pulsed-laser deposition has been studied using in situ time-resolved surface x-ray diffraction in the temperature range of 310°C to 780°C. Using a two-detector configuration, surface x-ray diffraction intensities were monitored simultaneously at the (0 0 1 2) specular and the (0 1 1 2) off-specular truncation rod positions. Abrupt intensity changes in both the specular and off-specular rods after laser pulses indicated prompt crystallization into SrTiO3 layers followed by slower intra- and interlayer surface rearrangements on time scales of seconds. Specular rod intensity oscillations indicated layer-by-layer growth, while off-specular rod intensity measurements suggested the presence of transient in-plane lattice distortions for depositions above 600°C.",

author = "G. Eres and Tischler, {J. Z.} and M. Yoon and Larson, {B. C.} and Rouleau, {C. M.} and Lowndes, {D. H.} and P. Zschack",

year = "2002",

month = may,

day = "6",

doi = "10.1063/1.1477279",

language = "English",

volume = "80",

pages = "3379--3381",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "18",

}

TY - JOUR

T1 - Time-resolved study of SrTiO3 homoepitaxial pulsed-laser deposition using surface x-ray diffraction

AU - Eres, G.

AU - Tischler, J. Z.

AU - Yoon, M.

AU - Larson, B. C.

AU - Rouleau, C. M.

AU - Lowndes, D. H.

AU - Zschack, P.

PY - 2002/5/6

Y1 - 2002/5/6

N2 - Homoepitaxy of SrTiO3 by pulsed-laser deposition has been studied using in situ time-resolved surface x-ray diffraction in the temperature range of 310°C to 780°C. Using a two-detector configuration, surface x-ray diffraction intensities were monitored simultaneously at the (0 0 1 2) specular and the (0 1 1 2) off-specular truncation rod positions. Abrupt intensity changes in both the specular and off-specular rods after laser pulses indicated prompt crystallization into SrTiO3 layers followed by slower intra- and interlayer surface rearrangements on time scales of seconds. Specular rod intensity oscillations indicated layer-by-layer growth, while off-specular rod intensity measurements suggested the presence of transient in-plane lattice distortions for depositions above 600°C.

AB - Homoepitaxy of SrTiO3 by pulsed-laser deposition has been studied using in situ time-resolved surface x-ray diffraction in the temperature range of 310°C to 780°C. Using a two-detector configuration, surface x-ray diffraction intensities were monitored simultaneously at the (0 0 1 2) specular and the (0 1 1 2) off-specular truncation rod positions. Abrupt intensity changes in both the specular and off-specular rods after laser pulses indicated prompt crystallization into SrTiO3 layers followed by slower intra- and interlayer surface rearrangements on time scales of seconds. Specular rod intensity oscillations indicated layer-by-layer growth, while off-specular rod intensity measurements suggested the presence of transient in-plane lattice distortions for depositions above 600°C.

UR - http://www.scopus.com/inward/record.url?scp=79956010638&partnerID=8YFLogxK

U2 - 10.1063/1.1477279

DO - 10.1063/1.1477279

M3 - Article

AN - SCOPUS:79956010638

SN - 0003-6951

VL - 80

SP - 3379

EP - 3381

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 18

ER -

Time-resolved study of SrTiO₃ homoepitaxial pulsed-laser deposition using surface x-ray diffraction

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