| Original language | English |
|---|---|
| Pages (from-to) | 196-198 |
| Number of pages | 3 |
| Journal | Transactions of the American Nuclear Society |
| Volume | 132 |
| Issue number | 1 |
| DOIs | |
| State | Published - 2025 |
| Event | ANS Annual Conference, 2025 - Chicago, United States Duration: Jun 15 2025 → Jun 18 2025 |
Threshold Analysis of Modelling and Measurement Accuracies in Muon Scattering Tomography
Julia Niedermeier, Junghyun Bae, Maik Stuke
Research output: Contribution to journal › Conference article › peer-review