Abstract
Three-dimensional vector imaging of bias-induced displacements of surfaces of ionically conductive materials using electrochemical strain microscopy (ESM) is demonstrated for model polycrystalline LiCoO 2 surface. We demonstrate that resonance enhanced imaging using band excitation detection can be performed both for out-of-plane and in-plane response components at flexural and torsional resonances of the cantilever, respectively. The image formation mechanism in vector ESM is analyzed and relationship between measured signal and grain orientation is discussed.
| Original language | English |
|---|---|
| Article number | 052020 |
| Journal | Journal of Applied Physics |
| Volume | 112 |
| Issue number | 5 |
| DOIs | |
| State | Published - Sep 1 2012 |
Funding
The experiments were performed with support provided by the U.S. Department of Energy, Basic Energy Sciences, Materials Sciences and Engineering Division through the Office of Science Early Career Research Program. Experimental capabilities and part of the data analysis were supported by the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. The samples were provided through the Vehicle Technologies Program for the Office of Energy Efficiency and Renewable Energy at Oak Ridge National Laboratory, managed by UT Battelle, LLC, for the U.S. Department of Energy under contract DE-AC05-00OR22725.
| Funders | Funder number |
|---|---|
| Center for Nanophase Materials Sciences | |
| Scientific User Facilities Division | |
| U.S. Department of Energy | |
| Office of Science | |
| Office of Energy Efficiency and Renewable Energy | |
| Basic Energy Sciences | |
| Oak Ridge National Laboratory | |
| Division of Materials Sciences and Engineering | |
| UT-Battelle | DE-AC05-00OR22725 |