@article{9c89b73d1d0a450bbcecbb4fa8ee7911,
title = "Three-dimensional location of a single dopant with atomic precision by aberration-corrected scanning transmission electron microscopy",
abstract = "Materials properties, such as optical and electronic response, can be greatly enhanced by isolated single dopants. Determining the full three-dimensional single-dopant defect structure and spatial distribution is therefore critical to understanding and adequately tuning functional properties. Combining quantitative Z-contrast scanning transmission electron microscopy images with image simulations, we show the direct determination of the atomic-scale depth location of an optically active, single atom Ce dopant embedded within wurtzite-type AlN. The method represents a powerful new tool for reconstructing three-dimensional information from a single, two-dimensional image.",
keywords = "Three-dimensional imaging, atomic-resolution ADF STEM, photoluminescence, single dopant",
author = "Ryo Ishikawa and Lupini, {Andrew R.} and Findlay, {Scott D.} and Takashi Taniguchi and Pennycook, {Stephen J.}",
year = "2014",
month = apr,
day = "9",
doi = "10.1021/nl500564b",
language = "English",
volume = "14",
pages = "1903--1908",
journal = "Nano Letters",
issn = "1530-6984",
publisher = "American Chemical Society",
number = "4",
}