Thickness dependence of superconducting critical current density in vicinal YBa 2Cu 3O 7-δ thick films

R. L.S. Emergo; J. Z. Wu; T. Aytug; D. K. Christen

doi:10.1063/1.1775882

Thickness dependence of superconducting critical current density in vicinal YBa ₂Cu ₃O _7-δ thick films

R. L.S. Emergo, J. Z. Wu, T. Aytug, D. K. Christen

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

58 Scopus citations

Abstract

The thickness dependence of superconducting critical current density in YBa ₂Cu ₃O _7-δ thick films was investigated. YBCO thick films with thickness ranging from 0.2 to 3.0μm were deposited on flat and miscut SrTiO ₃ substrates. Switching from island-type growth to step-flow growth was observed, which was accompanied by a highly porous microstructure. It was found that the film microstructures were correlated strongly with the J _c-t behavior. The results show that higher J _c's and smaller J _c decrease with film thickness on vicinal YBCO films, which suggests that the porous structure may be favorable for high temperature superconductor thick film coated conductors.

Original language	English
Pages (from-to)	618-620
Number of pages	3
Journal	Applied Physics Letters
Volume	85
Issue number	4
DOIs	https://doi.org/10.1063/1.1775882
State	Published - Jul 26 2004

Funding

J.Z.W. acknowledges support from NSF and DOE for this work. R.E. was supported by AFOSR. The research at ORNL was sponsored by the U.S. Department of Energy under Contract No. DE-AC05-00OR22725 with the Oak Ridge National Laboratory, managed by UT-Battelle, LLC.

Funders	Funder number
National Science Foundation
U.S. Department of Energy	DE-AC05-00OR22725
Air Force Office of Scientific Research
Oak Ridge National Laboratory
UT-Battelle

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abstract = "The thickness dependence of superconducting critical current density in YBa 2Cu 3O 7-δ thick films was investigated. YBCO thick films with thickness ranging from 0.2 to 3.0μm were deposited on flat and miscut SrTiO 3 substrates. Switching from island-type growth to step-flow growth was observed, which was accompanied by a highly porous microstructure. It was found that the film microstructures were correlated strongly with the J c-t behavior. The results show that higher J c's and smaller J c decrease with film thickness on vicinal YBCO films, which suggests that the porous structure may be favorable for high temperature superconductor thick film coated conductors.",

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AU - Emergo, R. L.S.

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AU - Christen, D. K.

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AB - The thickness dependence of superconducting critical current density in YBa 2Cu 3O 7-δ thick films was investigated. YBCO thick films with thickness ranging from 0.2 to 3.0μm were deposited on flat and miscut SrTiO 3 substrates. Switching from island-type growth to step-flow growth was observed, which was accompanied by a highly porous microstructure. It was found that the film microstructures were correlated strongly with the J c-t behavior. The results show that higher J c's and smaller J c decrease with film thickness on vicinal YBCO films, which suggests that the porous structure may be favorable for high temperature superconductor thick film coated conductors.

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Thickness dependence of superconducting critical current density in vicinal YBa ₂Cu ₃O _7-δ thick films

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