Thickness dependence of microstructure and critical current density of YBa2Cu3O7-δ on rolling-assisted biaxially textured substrates

K. J. Leonard; A. Goyal; D. M. Kroeger; J. W. Jones; S. Kang; N. Rutter; M. Paranthaman; D. F. Lee; B. W. Kang

doi:10.1557/JMR.2003.0153

Thickness dependence of microstructure and critical current density of YBa₂Cu₃O_7-δ on rolling-assisted biaxially textured substrates

K. J. Leonard, A. Goyal, D. M. Kroeger, J. W. Jones, S. Kang, N. Rutter, M. Paranthaman, D. F. Lee, B. W. Kang

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The change in microstructure associated with the decrease in critical current density (J_c) of YBa₂Cu₃O_7-δ (YBCO) films with increasing thickness was examined. Samples of pulse laser deposited YBCO films varying in thickness from 0.19 to 3.0 μm on rolling-assisted biaxially textured substrates with an architecture of CeO₂/YSZ/CeO₂/Ni were prepared by tripod polishing for cross-sectional electron microscopy. More randomly oriented grains in the upper portion of the YBCO film surface were observed with increasing film thickness, resulting in less cube texture. In addition, increases in mismatch across the boundaries of the c-axis grains with increasing time during deposition, along with the development of BaCeO₃ and Y₂BaCuO₅ phases at the YBCO/CeO₂ interface, contributed to the degradation of film properties. Surface outgrowths of the YBCO film were examined as well as the defect structures and second-phase formations within the films.

Original language	English
Pages (from-to)	1109-1122
Number of pages	14
Journal	Journal of Materials Research
Volume	18
Issue number	5
DOIs	https://doi.org/10.1557/JMR.2003.0153
State	Published - May 2003

Funding

Research was sponsored by the United States Department of Energy, Office of Energy Efficiency and Renewable Energy, and Office of Power Technologies— Superconductivity Program. This research was performed at the Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the United States Department of Energy under Contract No. DE-AC05-00OR22725. K.J.L., B.W.K., and S.K. are grateful to the Oak Ridge Associated Universities for their support. Additional thanks are expressed to P.M. Martin for silver coating the samples examined and to S. Sathyamurthy for his work on RBS.

Funders	Funder number
United States Department of Energy
Office of Energy Efficiency and Renewable Energy
Oak Ridge National Laboratory
Water Power Technologies Office

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title = "Thickness dependence of microstructure and critical current density of YBa2Cu3O7-δ on rolling-assisted biaxially textured substrates",

abstract = "The change in microstructure associated with the decrease in critical current density (Jc) of YBa2Cu3O7-δ (YBCO) films with increasing thickness was examined. Samples of pulse laser deposited YBCO films varying in thickness from 0.19 to 3.0 μm on rolling-assisted biaxially textured substrates with an architecture of CeO2/YSZ/CeO2/Ni were prepared by tripod polishing for cross-sectional electron microscopy. More randomly oriented grains in the upper portion of the YBCO film surface were observed with increasing film thickness, resulting in less cube texture. In addition, increases in mismatch across the boundaries of the c-axis grains with increasing time during deposition, along with the development of BaCeO3 and Y2BaCuO5 phases at the YBCO/CeO2 interface, contributed to the degradation of film properties. Surface outgrowths of the YBCO film were examined as well as the defect structures and second-phase formations within the films.",

author = "Leonard, {K. J.} and A. Goyal and Kroeger, {D. M.} and Jones, {J. W.} and S. Kang and N. Rutter and M. Paranthaman and Lee, {D. F.} and Kang, {B. W.}",

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AU - Goyal, A.

AU - Kroeger, D. M.

AU - Jones, J. W.

AU - Kang, S.

AU - Rutter, N.

AU - Paranthaman, M.

AU - Lee, D. F.

AU - Kang, B. W.

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N2 - The change in microstructure associated with the decrease in critical current density (Jc) of YBa2Cu3O7-δ (YBCO) films with increasing thickness was examined. Samples of pulse laser deposited YBCO films varying in thickness from 0.19 to 3.0 μm on rolling-assisted biaxially textured substrates with an architecture of CeO2/YSZ/CeO2/Ni were prepared by tripod polishing for cross-sectional electron microscopy. More randomly oriented grains in the upper portion of the YBCO film surface were observed with increasing film thickness, resulting in less cube texture. In addition, increases in mismatch across the boundaries of the c-axis grains with increasing time during deposition, along with the development of BaCeO3 and Y2BaCuO5 phases at the YBCO/CeO2 interface, contributed to the degradation of film properties. Surface outgrowths of the YBCO film were examined as well as the defect structures and second-phase formations within the films.

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Thickness dependence of microstructure and critical current density of YBa₂Cu₃O_7-δ on rolling-assisted biaxially textured substrates

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