Thickness and strain dependence of piezoelectric coefficient in BaTiO3 thin films

K. P. Kelley, D. E. Yilmaz, L. Collins, Y. Sharma, H. N. Lee, D. Akbarian, A. C.T. Van Duin, P. Ganesh, R. K. Vasudevan

Research output: Contribution to journal › Article › peer-review

36 Scopus citations

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