Thermoplasmonic shift and dispersion in thin metal films

A. L. Lereu, A. Passian, R. H. Farahi, N. F. Van Hulst, T. L. Ferrell, T. Thundat

Research output: Contribution to journalArticlepeer-review

25 Scopus citations

Abstract

In 2004, the authors reported two coupling schemes based on the thermo-optic properties of thin metallic films and their associated sub- and superstrates, by utilizing surface plasmons. These studies showed a potential for all-optical modulation at low rates that may be used for sensing purposes. In this article, they continue by investigating thermal processes involved in thin metallic films with different approaches. They first experimentally imaged the shift of the surface plasmon dispersion relation in the visible spectrum, as the thin film temperature is externally varied. They then reinforce the previous observations by collecting the absorption curves at selected visible photon energies of excitation, as the film temperature in the excitation region increases. Utilizing the absorption measurements, they briefly address how one may obtain the real and imaginary parts of the index of refraction of the thin film as a function of temperature for each involved wavelength. Finally, they investigate the local physical state of the film by optically profiling the surface plasmon excitation region.

Original languageEnglish
Pages (from-to)836-841
Number of pages6
JournalJournal of Vacuum Science and Technology, Part A: Vacuum, Surfaces and Films
Volume26
Issue number4
DOIs
StatePublished - 2008

Funding

This work was supported in part by the SERRI Program of DHS and by the DOE ERSP Program. Oak Ridge National Laboratory in Oak Ridge, Tennessee 37831-6123 is managed by UT-Battelle, LLC for the Department of Energy under Contract No. DE-AC05-0096OR22725. The authors would like to dedicate this article to the memory of the deceased E. Arakawa for his fruitful discussions and his constant support.

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