Thermoelectric Limitations of Graphene Nanodevices at Ultrahigh Current Densities

Charalambos Evangeli, Jacob Swett, Jean Spiece, Edward McCann, Jasper Fried, Achim Harzheim, Andrew R. Lupini, G. Andrew D. Briggs, Pascal Gehring, Stephen Jesse, Oleg V. Kolosov, Jan A. Mol, Ondrej Dyck

Research output: Contribution to journalArticlepeer-review

1 Scopus citations

Abstract

Graphene is atomically thin, possesses excellent thermal conductivity, and is able to withstand high current densities, making it attractive for many nanoscale applications such as field-effect transistors, interconnects, and thermal management layers. Enabling integration of graphene into such devices requires nanostructuring, which can have a drastic impact on the self-heating properties, in particular at high current densities. Here, we use a combination of scanning thermal microscopy, finite element thermal analysis, and operando scanning transmission electron microscopy techniques to observe prototype graphene devices in operation and gain a deeper understanding of the role of geometry and interfaces during high current density operation. We find that Peltier effects significantly influence the operational limit due to local electrical and thermal interfacial effects, causing asymmetric temperature distribution in the device. Thus, our results indicate that a proper understanding and design of graphene devices must include consideration of the surrounding materials, interfaces, and geometry. Leveraging these aspects provides opportunities for engineered extreme operation devices.

Original languageEnglish
Pages (from-to)11153-11164
Number of pages12
JournalACS Nano
Volume18
Issue number17
DOIs
StatePublished - Apr 30 2024

Funding

This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division (A.R.L., S.J., O.D.) and by the Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility (O.D.). C.E., J.L.S., J.P.F., and G.A.D.B. acknowledge the QuEEN Programme grant (EP/N017188/1). J.S. acknowledges financial support from the F.R.S.-F.N.R.S. of Belgium (FNRS-CR-1.B.463.22-MouleFrits). C.E. acknowledges the support of the European Graphene Flagship Core3 project (grant agreement no. 881603). P.G. acknowledges financial support from the F.R.S.-FNRS of Belgium (FNRS-CQ-1.C044.21-SMARD, FNRS-CDR-J.0068.21-SMARD, FNRS-MIS-F.4523.22-TopoBrain), from the Federation Wallonie-Bruxelles through the ARC grant no. 21/26-116, and from the EU (ERC-StG-10104144-MOUNTAIN). This project (40007563-CONNECT) has received funding from the FWO and F.R.S.-FNRS under the Excellence of Science (EOS) programme. J.A.M. was supported through the UKRI Future Leaders Fellowship, grant no. MR/S032541/1, with in-kind support from the Royal Academy of Engineering. O.V.K. acknowledges the support of the European Graphene Flagship Core3 project (grant agreement no. 881603), NPL Quantum Programme (BEIS), EPSRC EP/V00767 X/1 HiWiN project, UKRI Nexgenna project. The authors acknowledge use of characterization facilities within the David Cockayne Centre for Electron Microscopy, Department of Materials, University of Oxford, alongside financial support provided by the Henry Royce Institute (grant ref EP/R010145/1).

Keywords

  • Joule heating
  • Peltier effect
  • Seebeck coefficient
  • graphene
  • high current density
  • scanning thermal microscopy
  • scanning transmission electron microscopy

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