Abstract
The polymer network structure of epoxy thermosets plays a significant role in its final material properties. However, the effects of mild thermal exposure on these network structures are poorly studied. In this work, wide-angle X-ray scattering was used to investigate the polymer network structure of two epoxy thermosets: homopolymerized bisphenol A (BPA) epoxy resin and BPA epoxy resin cured with a polyether amine hardener (BPA/T-403). Using density functional theory and wide-angle X-ray scattering, insights into the polymer network structure were obtained. Diffraction features were determined to originate from hardener-to-hardener molecular distance, perpendicular π-π stacking of aromatic p-phenylene rings, and the average carbon-carbon distance in the polymer. Thermal exposure was found to permanently alter these structural features for both thermosets, with an increase in the π-π stacking distance. Homopolymerized BPA had an additional decrease in the hardener-to-hardener distance. These structural alterations were found to be detectable using Fourier transform infrared spectroscopy and Raman spectroscopy, with changes in the hardener-to-hardener distance having the largest variations in the resulting spectra specifically at the aromatic and ether frequencies.
Original language | English |
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Pages (from-to) | 5961-5971 |
Number of pages | 11 |
Journal | ACS Applied Polymer Materials |
Volume | 5 |
Issue number | 8 |
DOIs | |
State | Published - Aug 11 2023 |
Funding
WAXS data measurements were carried out on a Xeuss 3 small-angle X-ray scattering/WAXS instrument via the Oak Ridge National Laboratory instrumentation pool. Resources and data interpretation were made possible via a full user proposal (proposal number: CNMS2022-A-01189) to the Center for Nanophase Materials Sciences, which is a US Department of Energy Office of Science User Facility. This research used resources of the Compute and Data Environment for Science (CADES) at Oak Ridge National Laboratory, which is supported by the Office of Science of the U.S. Department of Energy under contract No. DE-AC05-00OR22725. This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan ( http://energy.gov/downloads/doe-public-access-plan ). Acknowledgments
Funders | Funder number |
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Center for Nanophase Materials Sciences | |
U.S. Department of Energy | DE-AC05-00OR22725 |
Office of Science | |
Oak Ridge National Laboratory |
Keywords
- bisphenol A epoxy resin
- epoxy thermoset
- polymer
- principal component analysis
- wide-angle X-ray scattering