Abstract
Polycrystalline Ba 8Ga x Ge 46-x exhibits promising thermoelectric performance with the figure of merit ZT close to that of single crystals. Polycrystalline Ba 8Ga x Ge 46-x is promising for applications, but reproducibility and thermal stability of thermoelectric properties need to be demonstrated. Polycrystalline samples of Ba 8+dGa x Ge 46-x -type clathrates (15.0 = x = 16.8 with varied nominal Ga content and d = 0 or 0.2) were prepared by direct reaction of the elements, followed by ball milling and hot pressing. Trace Ge impurity was observed (<1.0 wt.%) depending on the synthesis method. The electrical resistivity was stable in measurements up to 1000 K, regardless of Ge impurity. However, measurements to 1050 K resulted in irreversible increase in carrier concentration while the carrier mobility remained unchanged.
Original language | English |
---|---|
Pages (from-to) | 1423-1426 |
Number of pages | 4 |
Journal | Journal of Electronic Materials |
Volume | 38 |
Issue number | 7 |
DOIs | |
State | Published - Jul 2009 |
Externally published | Yes |
Funding
The Beckman Institute at Caltech, the Swedish Bengt Lundqvist Minne Foundation, and JPL-NASA are greatly acknowledged for financial support.
Funders | Funder number |
---|---|
JPL-NASA | |
Swedish Bengt Lundqvist Minne Foundation | |
Beckman Institute, California Institute of Technology |
Keywords
- Ba Ga Ge
- Carrier concentration
- Clathrate
- Electrical resistivity
- Thermoelectricity