Thermal nitridation enhanced diffusion of Sb and Si(100) doping superlattices

Research output: Contribution to journalArticlepeer-review

10 Scopus citations

Abstract

Depth dependent nitridation enhanced diffusion (NED) of Sb was investigated by annealing Si(100) doping superlattice (DSL) structures in NH, at 810-910°C for 15-180 min. These multilayered DSLs consisted of six 10 nm wide Sb doping spikes spaced 100 nm apart. Antimony NED, attributed to vacancy injection, indicated vacancy supersaturation values of 3-5. From the spatial decay of Sb NED, lower bounds for vacancy diffusivities of (7.9±1.4)±10-14, (1.2±0.2) × 10-12, and 2.1 × 10-11 cM2/s were obtained at 810, 860, and 910°C, respectively. Evidence of trap limited vacancy diffusivity was observed.

Original languageEnglish
Pages (from-to)1273-1275
Number of pages3
JournalApplied Physics Letters
Volume69
Issue number9
DOIs
StatePublished - Aug 26 1996
Externally publishedYes

Fingerprint

Dive into the research topics of 'Thermal nitridation enhanced diffusion of Sb and Si(100) doping superlattices'. Together they form a unique fingerprint.

Cite this