Thermal expansion in UO2 determined by high-energy X-ray diffraction

M. Guthrie; C. J. Benmore; L. B. Skinner; O. L.G. Alderman; J. K.R. Weber; J. B. Parise; M. Williamson

doi:10.1016/j.jnucmat.2016.06.042

Thermal expansion in UO₂ determined by high-energy X-ray diffraction

M. Guthrie, C. J. Benmore, L. B. Skinner, O. L.G. Alderman, J. K.R. Weber, J. B. Parise, M. Williamson

Research output: Contribution to journal › Article › peer-review

10 Scopus citations

Abstract

Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO₂ up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.

Original language	English
Pages (from-to)	19-22
Number of pages	4
Journal	Journal of Nuclear Materials
Volume	479
DOIs	https://doi.org/10.1016/j.jnucmat.2016.06.042
State	Published - Oct 1 2016
Externally published	Yes

Funding

We thank Rick Spence and Dr. Doug Robinson for technical support during the experiments and for useful discussions. Dr. Marius Stan is thanked for useful discussions. The Advanced Photon Source, Argonne National Laboratory , is funded under U.S. DOE, BES, contract number DE-AC02-06CH11357 . This work was also supported by the U.S. Department of Energy (DOE), Small Business Innovation Research grant DE SC0007564 (X-ray experiment, J.K.R.W., O.L.G.A.) and the Office of Basic Energy Sciences (BES) grant DE-FG02-09ER46650 (L.B.S. and J.B.P).

Funders	Funder number
Advanced Photon Source
U.S. Department of Energy
Basic Energy Sciences	DE-FG02-09ER46650, DE-AC02-06CH11357
Argonne National Laboratory
Small Business Innovation Research	DE SC0007564

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abstract = "Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO2 up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.",

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AU - Weber, J. K.R.

AU - Parise, J. B.

AU - Williamson, M.

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AB - Here we present crystallographic analyses of high-energy X-ray diffraction data on polycrystalline UO2 up to the melting temperature. The Rietveld refinements of our X-ray data are in agreement with previous measurements, but are systematically located around the upper bound of their uncertainty, indicating a slightly steeper trend of thermal expansion compared to established values. This observation is consistent with recent first principles calculations.

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Thermal expansion in UO₂ determined by high-energy X-ray diffraction

Abstract

Funding

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