Abstract
Implantation and plasma indiffusion of H in crystalline Si are known to induce planar defects (platelets) whose structure has remained elusive. We report extensive first-principles calculations that reveal mechanisms for the nucleation and growth of aggregates of second-neighbor hydrogenated vacancies. These defects exhibit the key features associated with platelets, including a preference for (111) and (100) planes, H release, and trapping of H2 molecules.
| Original language | English |
|---|---|
| Pages (from-to) | 4870-4873 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 82 |
| Issue number | 24 |
| DOIs | |
| State | Published - 1999 |
| Externally published | Yes |