The width of the water/2-heptanone liquid-liquid interface

Guangming Luo; Sarka Malkova; Sai Venkatesh Pingali; David G. Schultz; Binhua Lin; Mati Meron; Timothy J. Graber; Jeffrey Gebhardt; Petr Vanysek; Mark L. Schlossman

doi:10.1016/j.elecom.2005.04.012

The width of the water/2-heptanone liquid-liquid interface

Guangming Luo
, Sarka Malkova
, Sai Venkatesh Pingali
, David G. Schultz
, Binhua Lin
, Mati Meron
, Timothy J. Graber
, Jeffrey Gebhardt
, Petr Vanysek
, Mark L. Schlossman

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Å is comparable to the value calculated from capillary wave theory (7.3 Å) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.

Original language	English
Pages (from-to)	627-630
Number of pages	4
Journal	Electrochemistry Communications
Volume	7
Issue number	6
DOIs	https://doi.org/10.1016/j.elecom.2005.04.012
State	Published - Jun 2005
Externally published	Yes

Funding

M.L.S. and P.V. acknowledge support from NSF-CHE0315691. ChemMatCARS is supported by NSF-CHE, NSF-DMR, and the US Department of Energy (DOE). The Advanced Photon Source at Argonne National Laboratory is supported by the US DOE, Office of Basic Energy Sciences.

Keywords

Interface
Liquid-liquid
Width
X-ray reflectivity

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10.1016/j.elecom.2005.04.012

Cite this

@article{677973556999456b8c828b390717f8b7,

title = "The width of the water/2-heptanone liquid-liquid interface",

abstract = "Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 {\AA} is comparable to the value calculated from capillary wave theory (7.3 {\AA}) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.",

keywords = "Interface, Liquid-liquid, Width, X-ray reflectivity",

author = "Guangming Luo and Sarka Malkova and Pingali, \{Sai Venkatesh\} and Schultz, \{David G.\} and Binhua Lin and Mati Meron and Graber, \{Timothy J.\} and Jeffrey Gebhardt and Petr Vanysek and Schlossman, \{Mark L.\}",

year = "2005",

month = jun,

doi = "10.1016/j.elecom.2005.04.012",

language = "English",

volume = "7",

pages = "627--630",

journal = "Electrochemistry Communications",

issn = "1388-2481",

publisher = "Elsevier",

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T1 - The width of the water/2-heptanone liquid-liquid interface

AU - Luo, Guangming

AU - Malkova, Sarka

AU - Pingali, Sai Venkatesh

AU - Schultz, David G.

AU - Lin, Binhua

AU - Meron, Mati

AU - Graber, Timothy J.

AU - Gebhardt, Jeffrey

AU - Vanysek, Petr

AU - Schlossman, Mark L.

PY - 2005/6

Y1 - 2005/6

N2 - Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Å is comparable to the value calculated from capillary wave theory (7.3 Å) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.

AB - Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Å is comparable to the value calculated from capillary wave theory (7.3 Å) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.

KW - Interface

KW - Liquid-liquid

KW - Width

KW - X-ray reflectivity

UR - https://www.scopus.com/pages/publications/21044442090

U2 - 10.1016/j.elecom.2005.04.012

DO - 10.1016/j.elecom.2005.04.012

M3 - Article

AN - SCOPUS:21044442090

SN - 1388-2481

VL - 7

SP - 627

EP - 630

JO - Electrochemistry Communications

JF - Electrochemistry Communications

IS - 6

ER -

The width of the water/2-heptanone liquid-liquid interface

Abstract

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Keywords

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