The width of the water/2-heptanone liquid-liquid interface

Guangming Luo, Sarka Malkova, Sai Venkatesh Pingali, David G. Schultz, Binhua Lin, Mati Meron, Timothy J. Graber, Jeffrey Gebhardt, Petr Vanysek, Mark L. Schlossman

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Å is comparable to the value calculated from capillary wave theory (7.3 Å) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.

Original languageEnglish
Pages (from-to)627-630
Number of pages4
JournalElectrochemistry Communications
Volume7
Issue number6
DOIs
StatePublished - Jun 2005
Externally publishedYes

Funding

M.L.S. and P.V. acknowledge support from NSF-CHE0315691. ChemMatCARS is supported by NSF-CHE, NSF-DMR, and the US Department of Energy (DOE). The Advanced Photon Source at Argonne National Laboratory is supported by the US DOE, Office of Basic Energy Sciences.

Keywords

  • Interface
  • Liquid-liquid
  • Width
  • X-ray reflectivity

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