Abstract
Synchrotron X-ray reflectivity is used to study the electron density as a function of depth through the bulk water/2-heptanone interface. The measured interfacial width of 7.0 ± 0.2 Å is comparable to the value calculated from capillary wave theory (7.3 Å) using the measured interfacial tension of 12.6 mN/m. This result is consistent with capillary wave theory and molecular dynamics simulations that describe a molecularly sharp interface roughened by thermal fluctuations.
Original language | English |
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Pages (from-to) | 627-630 |
Number of pages | 4 |
Journal | Electrochemistry Communications |
Volume | 7 |
Issue number | 6 |
DOIs | |
State | Published - Jun 2005 |
Externally published | Yes |
Funding
M.L.S. and P.V. acknowledge support from NSF-CHE0315691. ChemMatCARS is supported by NSF-CHE, NSF-DMR, and the US Department of Energy (DOE). The Advanced Photon Source at Argonne National Laboratory is supported by the US DOE, Office of Basic Energy Sciences.
Keywords
- Interface
- Liquid-liquid
- Width
- X-ray reflectivity