Abstract
We present results and discuss the use of aluminum nitride as a promising source material for Accelerator Mass Spectrometry (AMS) and Radioactive Ion Beams (RIBs) science applications of 26Al isotopes. The measurement of 26Al in geological samples by AMS is typically conducted on Al2O3 targets. However, Al2O3 is not an ideal source material because it does not form a prolific beam of Al- required for measuring low-levels of 26Al. Multiple samples of aluminum oxide (Al2O3), aluminum nitride (AlN), mixed Al2O3-AlN as well as aluminum fluoride (AlF3) were tested and compared using the ion source test facility and the stable ion beam (SIB) injector platform at the 25-MV tandem electrostatic accelerator at Oak Ridge National Laboratory. Negative ion currents of atomic and molecular aluminum were examined for each source material. It was found that pure AlN targets produced substantially higher beam currents than the other materials and that there was some dependence on the exposure of AlN to air. The applicability of using AlN as a source material for geological samples was explored by preparing quartz samples as Al2O3 and converting them to AlN using a carbothermal reduction technique, which involved reducing the Al2O3 with graphite powder at 1600 °C within a nitrogen atmosphere. The quartz material was successfully converted to AlN. Thus far, AlN proves to be a promising source material and could lead towards increasing the sensitivity of low-level 26Al AMS measurements. The potential of using AlN as a source material for nuclear physics is also very promising by placing 26AlN directly into a source to produce more intense radioactive beams of 26Al.
Original language | English |
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Pages (from-to) | 281-287 |
Number of pages | 7 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 361 |
DOIs | |
State | Published - Oct 15 2015 |
Funding
Special thanks to Prof. Yingkui Li from University of Tennessee for providing the purified quartz samples for the preparation of AMS targets. This material is based upon work sponsored by the Laboratory Directed Research and Development Program at Oak Ridge National Laboratory , managed by UT-Battelle, LLC , for the U.S. Department of Energy and is supported by the U.S. Department of Energy, Office of Science, Office of Nuclear Physics . This research used resources of the Holifield Radioactive Ion Beam Facility of Oak Ridge National Laboratory, which was a DOE Office of Science User Facility.
Keywords
- AMS
- Al
- Aluminum nitride
- Negative ion source