The use of advanced characterization to study transitions across solid state interfaces

The atomic-scale study of solid-solid interfaces in complex multi-phase multicomponent systems is a challenging but important endeavor. This article highlights the coupling of recently developed advanced characterization techniques, such as high resolution scanning transmission electron microscopy, carried out in an aberration-corrected microscope, and atom probe tomography, to address the structural and compositional transition at the atomic scale across solid-solid interfaces, such as the γ/γ′ interface in nickel-base superalloys and the α/β interface in titanium alloys. Possible implications of such investigations of the interface on the understanding of physical and mechanical properties are discussed.