The use of advanced characterization to study transitions across solid state interfaces

R. Srinivasan, R. Banerjee, G. B. Viswanathan, S. Nag, J. Y. Hwang, J. Tiley, H. L. Fraser

Research output: Contribution to journalReview articlepeer-review

5 Scopus citations

Abstract

The atomic-scale study of solid-solid interfaces in complex multi-phase multicomponent systems is a challenging but important endeavor. This article highlights the coupling of recently developed advanced characterization techniques, such as high resolution scanning transmission electron microscopy, carried out in an aberration-corrected microscope, and atom probe tomography, to address the structural and compositional transition at the atomic scale across solid-solid interfaces, such as the γ/γ′ interface in nickel-base superalloys and the α/β interface in titanium alloys. Possible implications of such investigations of the interface on the understanding of physical and mechanical properties are discussed.

Original languageEnglish
Pages (from-to)64-69
Number of pages6
JournalJOM
Volume62
Issue number12
DOIs
StatePublished - Dec 2010
Externally publishedYes

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