The Recording and Processing of Pulsed Laser Diode Spectra

Peter L. Fuhr, Thomas A. Maufer

Research output: Contribution to journalArticlepeer-review

Abstract

A system capable of measuring and statistically analyzing wavelength and intensity fluctuations in pulsed laser diode output beams has been developed. The snapshot wavelength-intensity performance of laser diodes emitting discrete short-duration optical pulse is determined by isolating and recording individual pulses. Statistical processing of the resultant data generates information about the magnitude and/or frequency of occurrence of power variations or wavelength fluctuations in narrow optical bands. The system configuration along with plots depicting results based on measurements taken for various laser diodes are presented.

Original languageEnglish
Pages (from-to)37-43
Number of pages7
JournalIEEE Transactions on Instrumentation and Measurement
VolumeIM-36
Issue number1
DOIs
StatePublished - Mar 1987
Externally publishedYes

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