The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks

Kevin M. Roccapriore, Max Schwarzer, Joshua Greaves, Jesse Farebrother, Riccardo Torsi, Rishabh Agarwal, Colton Bishop, Igor Mordatch, Ekin D. Cubuk, Aaron Courville, Marc G. Bellemare, Joshua Robinson, Pablo Samuel Castro, Sergei V. Kalinin

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)416-417
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

Funding

This research is sponsored by the INTERSECT Initiative as part of the Laboratory Directed Research and Development Program of Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the US Department of Energy under contract DE-AC05-00OR22725. The STEM experiments were supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Sciences and Engineering Division and Oak Ridge National Laboratory\u2019s Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. This manuscript has been authored by UT-Battelle, LLC, under contract DE-AC05-00OR22725 with the US Department of Energy (DOE). The US government retains and the publisher, by accepting the article for publication, acknowledges that the US government retains a nonexclusive, paid-up, irrevocable, worldwide license to publish or reproduce the published form of this manuscript, or allow others to do so, for US government purposes. DOE will provide public access to these results of federally sponsored research in accordance with the DOE Public Access Plan (http://energy.gov/downloads/doe-public-access-plan).

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