Original language | English |
---|---|
Pages (from-to) | 416-417 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 30 |
Issue number | 2024 |
DOIs | |
State | Published - Jul 24 2024 |
Event | 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: Jul 28 2024 → Aug 1 2024 |
The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks
Kevin M. Roccapriore, Max Schwarzer, Joshua Greaves, Jesse Farebrother, Riccardo Torsi, Rishabh Agarwal, Colton Bishop, Igor Mordatch, Ekin D. Cubuk, Aaron Courville, Marc G. Bellemare, Joshua Robinson, Pablo Samuel Castro, Sergei V. Kalinin
Research output: Contribution to journal › Conference article › peer-review