The Position Dependence of Electron Beam Induced Effects in 2D Materials with Deep Neural Networks

Kevin M. Roccapriore, Max Schwarzer, Joshua Greaves, Jesse Farebrother, Riccardo Torsi, Rishabh Agarwal, Colton Bishop, Igor Mordatch, Ekin D. Cubuk, Aaron Courville, Marc G. Bellemare, Joshua Robinson, Pablo Samuel Castro, Sergei V. Kalinin

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish
Pages (from-to)416-417
Number of pages2
JournalMicroscopy and Microanalysis
Volume30
Issue number2024
DOIs
StatePublished - Jul 24 2024
Event82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States
Duration: Jul 28 2024Aug 1 2024

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