The microwave surface impedance of MgB2 thin films

A. J. Purnell; A. A. Zhukov; T. Nurgaliev; G. Lamura; Y. Bugoslavsky; Z. Lockman; J. L. MacManus-Driscoll; H. Y. Zhai; H. M. Christen; M. P. Paranthaman; D. H. Lowndes; M. H. Jo; M. G. Blamire; Ling Hao; J. C. Gallop; L. F. Cohen

doi:10.1088/0953-2048/16/1/301

The microwave surface impedance of MgB₂ thin films

A. J. Purnell
, A. A. Zhukov
, T. Nurgaliev
, G. Lamura
, Y. Bugoslavsky
, Z. Lockman
, J. L. MacManus-Driscoll
, H. Y. Zhai
, H. M. Christen
, M. P. Paranthaman
, D. H. Lowndes
, M. H. Jo
, M. G. Blamire
, Ling Hao
, J. C. Gallop
, L. F. Cohen

Nanomaterials Chemistry Group

Research output: Contribution to journal › Article › peer-review

16 Scopus citations

Abstract

In this paper we present the results of measurements of the microwave surface impedance of a powder sample and two films of MgB₂. The powder sample has a T_c = 39 K and the films have T_c = 29 K and 38 K. These samples show different temperature dependences of the field penetration depth. Over a period of six months, the film with T_c = 38 K degraded to a T_c of 35 K. We compare the results on all samples with data obtained elsewhere and discuss the implications as far as is possible at this stage.

Original language	English
Pages (from-to)	1-6
Number of pages	6
Journal	Superconductor Science and Technology
Volume	16
Issue number	1
DOIs	https://doi.org/10.1088/0953-2048/16/1/301
State	Published - Jan 2003

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Purnell, A. J., Zhukov, A. A., Nurgaliev, T., Lamura, G., Bugoslavsky, Y., Lockman, Z., MacManus-Driscoll, J. L., Zhai, H. Y., Christen, H. M., Paranthaman, M. P., Lowndes, D. H., Jo, M. H., Blamire, M. G., Hao, L., Gallop, J. C., & Cohen, L. F. (2003). The microwave surface impedance of MgB₂ thin films. Superconductor Science and Technology, 16(1), 1-6. https://doi.org/10.1088/0953-2048/16/1/301

@article{5fdebe0de4c5445ba628f43b4af209cc,

title = "The microwave surface impedance of MgB2 thin films",

abstract = "In this paper we present the results of measurements of the microwave surface impedance of a powder sample and two films of MgB2. The powder sample has a Tc = 39 K and the films have Tc = 29 K and 38 K. These samples show different temperature dependences of the field penetration depth. Over a period of six months, the film with Tc = 38 K degraded to a Tc of 35 K. We compare the results on all samples with data obtained elsewhere and discuss the implications as far as is possible at this stage.",

author = "Purnell, \{A. J.\} and Zhukov, \{A. A.\} and T. Nurgaliev and G. Lamura and Y. Bugoslavsky and Z. Lockman and MacManus-Driscoll, \{J. L.\} and Zhai, \{H. Y.\} and Christen, \{H. M.\} and Paranthaman, \{M. P.\} and Lowndes, \{D. H.\} and Jo, \{M. H.\} and Blamire, \{M. G.\} and Ling Hao and Gallop, \{J. C.\} and Cohen, \{L. F.\}",

year = "2003",

month = jan,

doi = "10.1088/0953-2048/16/1/301",

language = "English",

volume = "16",

pages = "1--6",

journal = "Superconductor Science and Technology",

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Purnell, AJ, Zhukov, AA, Nurgaliev, T, Lamura, G, Bugoslavsky, Y, Lockman, Z, MacManus-Driscoll, JL, Zhai, HY, Christen, HM, Paranthaman, MP, Lowndes, DH, Jo, MH, Blamire, MG, Hao, L, Gallop, JC & Cohen, LF 2003, 'The microwave surface impedance of MgB₂ thin films', Superconductor Science and Technology, vol. 16, no. 1, pp. 1-6. https://doi.org/10.1088/0953-2048/16/1/301

TY - JOUR

T1 - The microwave surface impedance of MgB2 thin films

AU - Purnell, A. J.

AU - Zhukov, A. A.

AU - Nurgaliev, T.

AU - Lamura, G.

AU - Bugoslavsky, Y.

AU - Lockman, Z.

AU - MacManus-Driscoll, J. L.

AU - Zhai, H. Y.

AU - Christen, H. M.

AU - Paranthaman, M. P.

AU - Lowndes, D. H.

AU - Jo, M. H.

AU - Blamire, M. G.

AU - Hao, Ling

AU - Gallop, J. C.

AU - Cohen, L. F.

PY - 2003/1

Y1 - 2003/1

N2 - In this paper we present the results of measurements of the microwave surface impedance of a powder sample and two films of MgB2. The powder sample has a Tc = 39 K and the films have Tc = 29 K and 38 K. These samples show different temperature dependences of the field penetration depth. Over a period of six months, the film with Tc = 38 K degraded to a Tc of 35 K. We compare the results on all samples with data obtained elsewhere and discuss the implications as far as is possible at this stage.

AB - In this paper we present the results of measurements of the microwave surface impedance of a powder sample and two films of MgB2. The powder sample has a Tc = 39 K and the films have Tc = 29 K and 38 K. These samples show different temperature dependences of the field penetration depth. Over a period of six months, the film with Tc = 38 K degraded to a Tc of 35 K. We compare the results on all samples with data obtained elsewhere and discuss the implications as far as is possible at this stage.

UR - https://www.scopus.com/pages/publications/0037238257

U2 - 10.1088/0953-2048/16/1/301

DO - 10.1088/0953-2048/16/1/301

M3 - Article

AN - SCOPUS:0037238257

SN - 0953-2048

VL - 16

SP - 1

EP - 6

JO - Superconductor Science and Technology

JF - Superconductor Science and Technology

IS - 1

ER -

The microwave surface impedance of MgB₂ thin films

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