Abstract
Recent developments in pixelated detectors, when combined with aberration correction of probe forming optics have greatly enhanced the field of scanning electron diffraction. Differential phase contrast is now routine and deep learning has been proposed as a method to extract maximum information from diffraction patterns. This work examines the effects of temporal and spatial incoherence on convergent beam electron diffraction patterns and demonstrates that simple center of mass measurements cannot be naively interpreted. The inclusion of incoherence in deep learning data sets is also discussed.
| Original language | English |
|---|---|
| Article number | 113015 |
| Journal | Ultramicroscopy |
| Volume | 215 |
| DOIs | |
| State | Published - Aug 2020 |
Funding
This work is supported by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division , U.S. Department of Energy. Experimental work was performed at the Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility. This work is supported by the Office of Basic Energy Sciences, Materials Sciences and Engineering Division, U.S. Department of Energy. Experimental work was performed at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility.
| Funders | Funder number |
|---|---|
| CNMS | |
| Oak Ridge National Laboratory | |
| Office of Basic Energy Sciences | |
| U.S. Department of Energy | |
| Office of Science | |
| Basic Energy Sciences | |
| Division of Materials Sciences and Engineering |
Keywords
- CBED
- STEM
- Spatial incoherence
- Temporal incoherence