The effects of precipitates on CdZnTe device performance

G. S. Camarda; A. E. Bolotnikov; G. A. Carini; L. Li; G. W. Wright; R. B. James

doi:10.1117/12.619812

The effects of precipitates on CdZnTe device performance

G. S. Camarda, A. E. Bolotnikov, G. A. Carini, L. Li, G. W. Wright, R. B. James

Research output: Contribution to journal › Conference article › peer-review

6 Scopus citations

Abstract

A high-intensity X-ray beam collimated down to a 10-micrometer spot size, available at Brookhaven's National Synchrotron Light Source (NSLS), was employed to perform X-ray mapping to measure the correlation between microscopic defects (precipitates) and variations in the collected charges in long-drift CdZnTe (CZT) detectors. First, we use X-ray diffraction topography (XDT) measurements at the high-energy beamline and IR microscopy to identify the defects distribution and strains in the bulk of CZT crystals. Then, we perform X-ray raster scans of the CZT detectors to measure their responses with 10-micrometer spatial resolution. The brightness of the source allows for good statistics in very short times. Precipitates that were singled out with X-ray scans are locally investigated by applying pulse-shape analysis. The presentation discusses how precipitates affect the device performance.

Original language	English
Article number	592204
Pages (from-to)	1-7
Number of pages	7
Journal	Proceedings of SPIE - The International Society for Optical Engineering
Volume	5922
DOIs	https://doi.org/10.1117/12.619812
State	Published - 2005
Externally published	Yes
Event	Hard X-Ray and Gamma-Ray Detector Physics VII - San Diego, CA, United States Duration: Aug 1 2005 → Aug 3 2005

Keywords

CZT
CdZnTe
Frisch ring
Gamma map
IR
Inclusions
NSLS
Precipitates
X-ray detectors

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10.1117/12.619812

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title = "The effects of precipitates on CdZnTe device performance",

abstract = "A high-intensity X-ray beam collimated down to a 10-micrometer spot size, available at Brookhaven's National Synchrotron Light Source (NSLS), was employed to perform X-ray mapping to measure the correlation between microscopic defects (precipitates) and variations in the collected charges in long-drift CdZnTe (CZT) detectors. First, we use X-ray diffraction topography (XDT) measurements at the high-energy beamline and IR microscopy to identify the defects distribution and strains in the bulk of CZT crystals. Then, we perform X-ray raster scans of the CZT detectors to measure their responses with 10-micrometer spatial resolution. The brightness of the source allows for good statistics in very short times. Precipitates that were singled out with X-ray scans are locally investigated by applying pulse-shape analysis. The presentation discusses how precipitates affect the device performance.",

keywords = "CZT, CdZnTe, Frisch ring, Gamma map, IR, Inclusions, NSLS, Precipitates, X-ray detectors",

author = "Camarda, {G. S.} and Bolotnikov, {A. E.} and Carini, {G. A.} and L. Li and Wright, {G. W.} and James, {R. B.}",

year = "2005",

doi = "10.1117/12.619812",

language = "English",

volume = "5922",

pages = "1--7",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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note = "Hard X-Ray and Gamma-Ray Detector Physics VII ; Conference date: 01-08-2005 Through 03-08-2005",

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T1 - The effects of precipitates on CdZnTe device performance

AU - Camarda, G. S.

AU - Bolotnikov, A. E.

AU - Carini, G. A.

AU - Li, L.

AU - Wright, G. W.

AU - James, R. B.

PY - 2005

Y1 - 2005

N2 - A high-intensity X-ray beam collimated down to a 10-micrometer spot size, available at Brookhaven's National Synchrotron Light Source (NSLS), was employed to perform X-ray mapping to measure the correlation between microscopic defects (precipitates) and variations in the collected charges in long-drift CdZnTe (CZT) detectors. First, we use X-ray diffraction topography (XDT) measurements at the high-energy beamline and IR microscopy to identify the defects distribution and strains in the bulk of CZT crystals. Then, we perform X-ray raster scans of the CZT detectors to measure their responses with 10-micrometer spatial resolution. The brightness of the source allows for good statistics in very short times. Precipitates that were singled out with X-ray scans are locally investigated by applying pulse-shape analysis. The presentation discusses how precipitates affect the device performance.

AB - A high-intensity X-ray beam collimated down to a 10-micrometer spot size, available at Brookhaven's National Synchrotron Light Source (NSLS), was employed to perform X-ray mapping to measure the correlation between microscopic defects (precipitates) and variations in the collected charges in long-drift CdZnTe (CZT) detectors. First, we use X-ray diffraction topography (XDT) measurements at the high-energy beamline and IR microscopy to identify the defects distribution and strains in the bulk of CZT crystals. Then, we perform X-ray raster scans of the CZT detectors to measure their responses with 10-micrometer spatial resolution. The brightness of the source allows for good statistics in very short times. Precipitates that were singled out with X-ray scans are locally investigated by applying pulse-shape analysis. The presentation discusses how precipitates affect the device performance.

KW - CZT

KW - CdZnTe

KW - Frisch ring

KW - Gamma map

KW - IR

KW - Inclusions

KW - NSLS

KW - Precipitates

KW - X-ray detectors

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DO - 10.1117/12.619812

M3 - Conference article

AN - SCOPUS:31844456193

SN - 0277-786X

VL - 5922

SP - 1

EP - 7

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

M1 - 592204

T2 - Hard X-Ray and Gamma-Ray Detector Physics VII

Y2 - 1 August 2005 through 3 August 2005

ER -

The effects of precipitates on CdZnTe device performance

Abstract

Keywords

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