The effects of layering in ferroelectric Si-doped HfO2 thin films

  • Patrick D. Lomenzo
  • , Qanit Takmeel
  • , Chuanzhen Zhou
  • , Yang Liu
  • , Chris M. Fancher
  • , Jacob L. Jones
  • , Saeed Moghaddam
  • , Toshikazu Nishida

Research output: Contribution to journal › Article › peer-review

61 Scopus citations

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Material Science

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