The contribution of 180° domain wall motion to dielectric properties quantified from in situ X-ray diffraction

  • C. M. Fancher
  • , S. Brewer
  • , C. C. Chung
  • , S. Röhrig
  • , T. Rojac
  • , G. Esteves
  • , M. Deluca
  • , N. Bassiri-Gharb
  • , J. L. Jones

Research output: Contribution to journalArticlepeer-review

52 Scopus citations

Abstract

The contribution of 180° domain wall motion to polarization and dielectric properties of ferroelectric materials has yet to be determined experimentally. In this paper, an approach for estimating the extent of (180°) domain reversal during application of electric fields is presented. We demonstrate this method by determining the contribution of domain reversal to polarization in soft lead zirconate titanate during application of strong electric fields. At the maximum applied field, domain reversal was determined to account for >80% of the measured macroscopic polarization. We also apply the method to quantify the contribution of domain reversal to the weak-field dielectric permittivity of BaTiO3. The results of this analysis determined that domain reversal accounts for up to ∼70% of the macroscopic dielectric permittivity in BaTiO3. These results demonstrate the predominance of domain reversal to high and low-field dielectric response in ferroelectric polycrystalline materials.

Original languageEnglish
Pages (from-to)36-43
Number of pages8
JournalActa Materialia
Volume126
DOIs
StatePublished - Mar 1 2017
Externally publishedYes

Funding

C.M.F. and J.L.J authors acknowledge support for this work from the National Science Foundation, as part of the Center for Dielectrics and Piezoelectrics under Grant Nos. IIP-1361571 and IIP-1361503. G.E. and J.L.J. acknowledge the support from the National Science Foundation under Award No. DMR-1409399. S. R. and M. D. acknowledge support by the Federal Ministry for Transport, Innovation and Technology (bmvit) and Austrian Science Fund (FWF) under Grant TRP 302-N20. S.J.B. and N.B.G. acknowledge support from the National Science Foundation under grant numbers DMR-1255379 and CMMI-1537262. This research used resources of the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357.

Keywords

  • 180° domain reversal
  • Domain wall motion
  • In situ X-ray diffraction
  • Non-linear dielectric
  • Non-linear piezoelectric

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