TFS: Combined tilt- and focal series scanning transmission electron microscopy

  • Tim Dahmen
  • , Jean Pierre Baudoin
  • , Andrew R. Lupini
  • , Christian Kübel
  • , Philipp Slusallek
  • , Niels De Jonge

Research output: Contribution to journalConference articlepeer-review

1 Scopus citations
Original languageEnglish
Pages (from-to)786-787
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue number3
DOIs
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

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