| Original language | English |
|---|---|
| Pages (from-to) | 786-787 |
| Number of pages | 2 |
| Journal | Microscopy and Microanalysis |
| Volume | 20 |
| Issue number | 3 |
| DOIs | |
| State | Published - Aug 1 2014 |
| Event | Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014 |
TFS: Combined tilt- and focal series scanning transmission electron microscopy
- Tim Dahmen
- , Jean Pierre Baudoin
- , Andrew R. Lupini
- , Christian Kübel
- , Philipp Slusallek
- , Niels De Jonge
Research output: Contribution to journal › Conference article › peer-review
1
Scopus
citations