TFS: Combined tilt- and focal series scanning transmission electron microscopy

Tim Dahmen; Jean Pierre Baudoin; Andrew R. Lupini; Christian Kübel; Philipp Slusallek; Niels De Jonge

doi:10.1017/S1431927614005650

TFS: Combined tilt- and focal series scanning transmission electron microscopy

Tim Dahmen, Jean Pierre Baudoin, Andrew R. Lupini, Christian Kübel, Philipp Slusallek, Niels De Jonge

electron Microscopy and Microanalysis

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Original language	English
Pages (from-to)	786-787
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614005650
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

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@article{bd021d27ecb445b8825497c1c674f151,

title = "TFS: Combined tilt- and focal series scanning transmission electron microscopy",

author = "Tim Dahmen and Baudoin, {Jean Pierre} and Lupini, {Andrew R.} and Christian K{\"u}bel and Philipp Slusallek and {De Jonge}, Niels",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614005650",

language = "English",

volume = "20",

pages = "786--787",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

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TY - JOUR

T1 - TFS

T2 - Microscopy and Microanalysis 2014, M and M 2014

AU - Dahmen, Tim

AU - Baudoin, Jean Pierre

AU - Lupini, Andrew R.

AU - Kübel, Christian

AU - Slusallek, Philipp

AU - De Jonge, Niels

PY - 2014/8/1

Y1 - 2014/8/1

UR - http://www.scopus.com/inward/record.url?scp=84927933771&partnerID=8YFLogxK

U2 - 10.1017/S1431927614005650

DO - 10.1017/S1431927614005650

M3 - Conference article

AN - SCOPUS:84927933771

SN - 1431-9276

VL - 20

SP - 786

EP - 787

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

Y2 - 3 August 2014 through 7 August 2014

ER -

TFS: Combined tilt- and focal series scanning transmission electron microscopy

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