Texture by the kilometer

E. D. Specht; F. A. List

Texture by the kilometer

E. D. Specht, F. A. List

Deposition Science and Technology

Research output: Contribution to journal › Conference article › peer-review

1 Scopus citations

Abstract

A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa₂Cu₃O₇ (YBCO) superconductors.

Original language	English
Pages (from-to)	277-283
Number of pages	7
Journal	Materials Research Society Symposium - Proceedings
Volume	689
State	Published - 2002
Event	Materials for High-Temperature Superconductor Technologies - Boston, MA, United States Duration: Nov 26 2001 → Nov 29 2001

Cite this

@article{b0bec35e332848db93f1fa3b5b2fd764,

title = "Texture by the kilometer",

abstract = "A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors.",

author = "Specht, {E. D.} and List, {F. A.}",

year = "2002",

language = "English",

volume = "689",

pages = "277--283",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

note = "Materials for High-Temperature Superconductor Technologies ; Conference date: 26-11-2001 Through 29-11-2001",

}

TY - JOUR

T1 - Texture by the kilometer

AU - Specht, E. D.

AU - List, F. A.

PY - 2002

Y1 - 2002

N2 - A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors.

AB - A novel x-ray diffractometer has been used to characterize the texture of 2 km of textured tape in segments up to 20 m long. Techniques have been developed for the study of the uniformity of texture and for the detection of second phases, deviations from cube texture, and the sharpness of cube texture, in metal substrates, oxide buffer layers, and YBa2Cu3O7 (YBCO) superconductors.

UR - http://www.scopus.com/inward/record.url?scp=0036350752&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:0036350752

SN - 0272-9172

VL - 689

SP - 277

EP - 283

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Materials for High-Temperature Superconductor Technologies

Y2 - 26 November 2001 through 29 November 2001

ER -

Texture by the kilometer

Abstract

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