Temperature sensitivity and noise in thermoreflectance thermal imaging

Alexander Shakouri, Mohamed El Sayed Kayed, Amirkoushyar Ziabari, Dustin Kendig, Bjorn Vermeersch, Je Hyeong Bahk, Ali Shakouri

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Scopus citations

Abstract

Akin to any experimental system, thermoreflectance thermal imaging is not immune to different sources of noise. Although averaging the thermal images over long times can minimize the impact of the noise on the measurement, electrical, thermal and optical noises can still exist that can, subsequently, affect the accuracy of the temperature measurement. The goal of this work is to systematically look at the noise level in the thermal images obtained by visible wavelength thermoreflectance thermal imaging systems and to identify experimental parameters that can result in most accurate temperature measurements. In particular, we study the impact of the averaging time, selection of the objective lens, binning of the thermal images, signal level and time dependent noise effects in these systems.

Original languageEnglish
Title of host publication31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages216-220
Number of pages5
ISBN (Electronic)9781479986002
DOIs
StatePublished - Apr 30 2015
Externally publishedYes
Event31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015 - San Jose, United States
Duration: Mar 15 2015Mar 19 2015

Publication series

NameAnnual IEEE Semiconductor Thermal Measurement and Management Symposium
Volume2015-April
ISSN (Print)1065-2221

Conference

Conference31st Annual Semiconductor Thermal Measurement and Management Symposium, SEMI-THERM 2015
Country/TerritoryUnited States
CitySan Jose
Period03/15/1503/19/15

Keywords

  • Image Binning
  • Noise
  • Steady State
  • Thermoreflectance Thermal Imaging
  • Transient

Fingerprint

Dive into the research topics of 'Temperature sensitivity and noise in thermoreflectance thermal imaging'. Together they form a unique fingerprint.

Cite this