Abstract
Oxide p - n junctions of p -SrIn0.1Ti0.9O 3/n-SrNb0.01Ti0.99O3 (SITO/SNTO) are fabricated by laser molecular beam epitaxy. The current-voltage characteristics of the SITO/SNTO p - n junction are investigated mainly in the temperature range of 300-400 K. The SITO/SNTO junction exhibited good rectifying behaviour over the whole temperature range. Our results indicate a possibility of application of oxide p - n junction in higher temperatures in future electronic devices.
Original language | English |
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Pages (from-to) | 2209-2210 |
Number of pages | 2 |
Journal | Chinese Physics Letters |
Volume | 25 |
Issue number | 6 |
DOIs | |
State | Published - Jun 1 2008 |
Externally published | Yes |