Abstract
The interfacial microstructure of cross-sectional samples of Au films deposited on laser-irradiated sapphire was examined by TEM in order to gain some insight on the bonding mechanisms of metal-ceramic couples. Optically polished c-axis sapphire substrates were laser-irradiated and gold films were then sputter-deposited on these surfaces. After deposition, the specimens were annealed for one hour. A cross-sectional view of the gold film showed that the sapphire has two distinctive regions: a layer close to the gold film that exhibits a very rough interface and a gray substrate having a flat interface with the previous layer. It can be inferred that rapid cooling of the melted region after irradiation arrested the advance of the solidification front.
| Original language | English |
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| Pages | 814-815 |
| Number of pages | 2 |
| State | Published - 1994 |
| Externally published | Yes |
| Event | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994 |
Conference
| Conference | Proceedings of the 52nd Annual Meeting of the Microscopy Society of America |
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| City | New Orleans, LA, USA |
| Period | 07/31/94 → 08/5/94 |