TEM specimen preparation of thin interfacial coatings on continuous ceramic fibers using the Focused Ion Beam (FIB) technique

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1160-1161
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604886835
State	Published - 2004

Access to Document

@article{3d5a245fbb42413bb125d65a4f2b4ca3,

title = "TEM specimen preparation of thin interfacial coatings on continuous ceramic fibers using the Focused Ion Beam (FIB) technique",

author = "Coffey, \{D. W.\} and More, \{K. L.\} and T. Brummett",

year = "2004",

doi = "10.1017/S1431927604886835",

language = "English",

volume = "10",

pages = "1160--1161",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "SUPPL. 2",

}

TY - JOUR

T1 - TEM specimen preparation of thin interfacial coatings on continuous ceramic fibers using the Focused Ion Beam (FIB) technique

AU - Coffey, D. W.

AU - More, K. L.

AU - Brummett, T.

PY - 2004

Y1 - 2004

UR - https://www.scopus.com/pages/publications/4544224959

U2 - 10.1017/S1431927604886835

DO - 10.1017/S1431927604886835

M3 - Article

AN - SCOPUS:4544224959

SN - 1431-9276

VL - 10

SP - 1160

EP - 1161

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

ER -