TEM specimen preparation of thin interfacial coatings on continuous ceramic fibers using the Focused Ion Beam (FIB) technique

D. W. Coffey, K. L. More, T. Brummett

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	1160-1161
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	10
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/S1431927604886835
State	Published - 2004

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title = "TEM specimen preparation of thin interfacial coatings on continuous ceramic fibers using the Focused Ion Beam (FIB) technique",

author = "Coffey, {D. W.} and More, {K. L.} and T. Brummett",

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doi = "10.1017/S1431927604886835",

language = "English",

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publisher = "Oxford University Press",

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T1 - TEM specimen preparation of thin interfacial coatings on continuous ceramic fibers using the Focused Ion Beam (FIB) technique

AU - Coffey, D. W.

AU - More, K. L.

AU - Brummett, T.

PY - 2004

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JO - Microscopy and Microanalysis

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