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TaN interface properties and electric field cycling effects on ferroelectric Si-doped HfO2 thin films
Patrick D. Lomenzo, Qanit Takmeel, Chuanzhen Zhou, Chris M. Fancher, Eric Lambers, Nicholas G. Rudawski, Jacob L. Jones, Saeed Moghaddam, Toshikazu Nishida
Research output: Contribution to journal › Article › peer-review
177
Scopus
citations