Synthesis and ferroelectric properties of epitaxial BiFeO 3 thin films grown by sputtering

R. R. Das; D. M. Kim; S. H. Baek; C. B. Eom; F. Zavaliche; S. Y. Yang; R. Ramesh; Y. B. Chen; X. Q. Pan; X. Ke; M. S. Rzchowski; S. K. Streiffer

doi:10.1063/1.2213347

Synthesis and ferroelectric properties of epitaxial BiFeO ₃ thin films grown by sputtering

R. R. Das, D. M. Kim, S. H. Baek, C. B. Eom, F. Zavaliche, S. Y. Yang, R. Ramesh, Y. B. Chen, X. Q. Pan, X. Ke, M. S. Rzchowski, S. K. Streiffer

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Abstract

We have grown epitaxial BiFe O3 thin films with smooth surfaces on (001), (101), and (111) SrTi O3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFe O3 thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFe O3 on high miscut (4°) (001) SrTi O3, which attributes to a relatively high value of remanent polarization (∼71 μC cm2). Films grown on low miscut (0.8°) SrTi O3 have a small amount of impure phase α- Fe2 O3 which contributes to lower the polarization values (∼63 μC cm2). The BiFe O3 films grown on (101) and (111) SrTi O3 exhibited remanent polarizations of 86 and 98 μC cm2, respectively.

Original language	English
Article number	242904
Journal	Applied Physics Letters
Volume	88
Issue number	24
DOIs	https://doi.org/10.1063/1.2213347
State	Published - Jun 12 2006
Externally published	Yes

Funding

This work was supported by the National Science Foundation under Grant Nos. DMR-0313764, DMR-0315633 (for HRTEM), and ECS-0210449, ONR under Grant No. N000140510559, and a David & Lucile Packard Fellowship to one of the authors (C.B.E.). The authors wish to acknowledge the support by the University of Maryland NSF-MRSEC under Grant No. DMR 00-80008. Work at Argonne National Laboratory was supported by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. W-31-109-Eng-38.

Funders	Funder number
Office of Basic Energy Sciences
University of Maryland NSF-MRSEC
National Science Foundation	ECS-0210449, DMR-0313764, DMR-0315633
Office of Naval Research
U.S. Department of Energy
Office of Science

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title = "Synthesis and ferroelectric properties of epitaxial BiFeO 3 thin films grown by sputtering",

abstract = "We have grown epitaxial BiFe O3 thin films with smooth surfaces on (001), (101), and (111) SrTi O3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFe O3 thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFe O3 on high miscut (4°) (001) SrTi O3, which attributes to a relatively high value of remanent polarization (∼71 μC cm2). Films grown on low miscut (0.8°) SrTi O3 have a small amount of impure phase α- Fe2 O3 which contributes to lower the polarization values (∼63 μC cm2). The BiFe O3 films grown on (101) and (111) SrTi O3 exhibited remanent polarizations of 86 and 98 μC cm2, respectively.",

author = "Das, {R. R.} and Kim, {D. M.} and Baek, {S. H.} and Eom, {C. B.} and F. Zavaliche and Yang, {S. Y.} and R. Ramesh and Chen, {Y. B.} and Pan, {X. Q.} and X. Ke and Rzchowski, {M. S.} and Streiffer, {S. K.}",

year = "2006",

month = jun,

day = "12",

doi = "10.1063/1.2213347",

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AU - Das, R. R.

AU - Kim, D. M.

AU - Baek, S. H.

AU - Eom, C. B.

AU - Zavaliche, F.

AU - Yang, S. Y.

AU - Ramesh, R.

AU - Chen, Y. B.

AU - Pan, X. Q.

AU - Ke, X.

AU - Rzchowski, M. S.

AU - Streiffer, S. K.

PY - 2006/6/12

Y1 - 2006/6/12

N2 - We have grown epitaxial BiFe O3 thin films with smooth surfaces on (001), (101), and (111) SrTi O3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFe O3 thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFe O3 on high miscut (4°) (001) SrTi O3, which attributes to a relatively high value of remanent polarization (∼71 μC cm2). Films grown on low miscut (0.8°) SrTi O3 have a small amount of impure phase α- Fe2 O3 which contributes to lower the polarization values (∼63 μC cm2). The BiFe O3 films grown on (101) and (111) SrTi O3 exhibited remanent polarizations of 86 and 98 μC cm2, respectively.

AB - We have grown epitaxial BiFe O3 thin films with smooth surfaces on (001), (101), and (111) SrTi O3 substrates using sputtering. Four-circle x-ray diffraction and cross-sectional transmission electron microscopy show that the BiFe O3 thin films have rhombohedral symmetry although small monoclinic distortions have not been ruled out. Stripe ferroelectric domains oriented perpendicular to the substrate miscut direction and free of impurity phase are observed in BiFe O3 on high miscut (4°) (001) SrTi O3, which attributes to a relatively high value of remanent polarization (∼71 μC cm2). Films grown on low miscut (0.8°) SrTi O3 have a small amount of impure phase α- Fe2 O3 which contributes to lower the polarization values (∼63 μC cm2). The BiFe O3 films grown on (101) and (111) SrTi O3 exhibited remanent polarizations of 86 and 98 μC cm2, respectively.

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Synthesis and ferroelectric properties of epitaxial BiFeO ₃ thin films grown by sputtering

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