Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures

Patamas Bintachitt; Susan Trolier-Mckinstry; Katyayani Seal; Stephen Jesse; Sergei V. Kalinin

doi:10.1063/1.3070543

Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures

Patamas Bintachitt, Susan Trolier-Mckinstry, Katyayani Seal, Stephen Jesse, Sergei V. Kalinin

Center for Nanophase Matls Sciences

Research output: Contribution to journal › Article › peer-review

57 Scopus citations

Abstract

Polarization switching in polycrystalline PbZr_0.52 Ti _0.48 O₃ films on Pt-coated Si substrates was studied by switching spectroscopy piezoresponse force microscopy (SSPFM). Acquisition of multiple hysteresis loops allows polarization switching parameters, including nucleation, coercive biases, and switchable response to be mapped in real space. In contrast to measurements made on the free surface, those on the metal-ferroelectric-metal capacitor structures show the evolution of correlated switching of 10² - 10³ grain clusters with well-defined imprint and nucleation biases. The role of substrate bending on clustering and SSPFM detection mechanisms are discussed. These studies demonstrate real-space imaging of mesoscopic polarization reversal in real-world devices.

Original language	English
Article number	042906
Journal	Applied Physics Letters
Volume	94
Issue number	4
DOIs	https://doi.org/10.1063/1.3070543
State	Published - 2009

Funding

A part of this research was performed at Oak Ridge National Laboratory’s Center for Nanophase Materials Sciences and was sponsored by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy under contract DE-AC05-00OR22725 with Oak Ridge National Laboratory, managed and operated by UT-Battelle, LLC. P.B. and S.T.M. gratefully acknowledge support from the Center for Dielectric Studies. P.B. also acknowledges the support of Royal Thai Government. S.V.K. is grateful for Asylum Research Corporation for providing the beta-site for the HV PFM module. SSPFM is as available as a user facility at CNMS ( www.cnms.ornl.gov ).

Funders	Funder number
Center for Dielectric Studies
Oak Ridge National Laboratory
Royal Thai Government
Scientific User Facilities Division
U.S. Department of Energy	DE-AC05-00OR22725
Basic Energy Sciences
Oak Ridge National Laboratory

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abstract = "Polarization switching in polycrystalline PbZr0.52 Ti 0.48 O3 films on Pt-coated Si substrates was studied by switching spectroscopy piezoresponse force microscopy (SSPFM). Acquisition of multiple hysteresis loops allows polarization switching parameters, including nucleation, coercive biases, and switchable response to be mapped in real space. In contrast to measurements made on the free surface, those on the metal-ferroelectric-metal capacitor structures show the evolution of correlated switching of 102 - 103 grain clusters with well-defined imprint and nucleation biases. The role of substrate bending on clustering and SSPFM detection mechanisms are discussed. These studies demonstrate real-space imaging of mesoscopic polarization reversal in real-world devices.",

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AB - Polarization switching in polycrystalline PbZr0.52 Ti 0.48 O3 films on Pt-coated Si substrates was studied by switching spectroscopy piezoresponse force microscopy (SSPFM). Acquisition of multiple hysteresis loops allows polarization switching parameters, including nucleation, coercive biases, and switchable response to be mapped in real space. In contrast to measurements made on the free surface, those on the metal-ferroelectric-metal capacitor structures show the evolution of correlated switching of 102 - 103 grain clusters with well-defined imprint and nucleation biases. The role of substrate bending on clustering and SSPFM detection mechanisms are discussed. These studies demonstrate real-space imaging of mesoscopic polarization reversal in real-world devices.

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Switching spectroscopy piezoresponse force microscopy of polycrystalline capacitor structures

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