Switching spectroscopy piezoresponse force microscopy of ferroelectric materials

Stephen Jesse, Arthur P. Baddorf, Sergei V. Kalinin

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394 Scopus citations

Abstract

The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization.

Original languageEnglish
Article number062908
JournalApplied Physics Letters
Volume88
Issue number6
DOIs
StatePublished - Feb 2006

Funding

Research was supported by Oak Ridge National Laboratory, managed by UT-Battelle, LLC, for the U.S. Department of Energy under Contract No. DE-AC05-00OR22725.

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