Surface/interface-related conductivity in nanometer thick YSZ films

Igor Kosacki; Christopher M. Rouleau; Paul F. Becher; James Bentley; Douglas H. Lowndes

doi:10.1149/1.1809556

Surface/interface-related conductivity in nanometer thick YSZ films

Igor Kosacki, Christopher M. Rouleau, Paul F. Becher, James Bentley, Douglas H. Lowndes

Functional Hybrid Nanomaterials

Research output: Contribution to journal › Article › peer-review

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Abstract

Results of the electrical conductivity study of highly textured, ultrathin (15 nm) cubic yttria-stabilized zirconia (YSZ) thin films are presented for the first time. A nanoscale effect that results in exceptionally high ionic conductivity at moderate temperatures is detected in films less than 60 nm thick. The conductivity increases continuously below this level and reaches 0.6 S/cm at 800°C for a 15 nm thick film, which represents the highest reported value for the YSZ system. The observed behavior is attributed to an increasingly significant contribution of the surface/interface conductivity with decreasing film thickness. These observations can have important implications for the development of nanostructured electrochemical devices with enhanced performance. & copy; 2004 The Electrochemical Society. All rights reserved.

Original language	English
Article number	3
Pages (from-to)	A459-A461
Journal	Electrochemical and Solid-State Letters
Volume	7
Issue number	12
DOIs	https://doi.org/10.1149/1.1809556
State	Published - 2004

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title = "Surface/interface-related conductivity in nanometer thick YSZ films",

abstract = "Results of the electrical conductivity study of highly textured, ultrathin (15 nm) cubic yttria-stabilized zirconia (YSZ) thin films are presented for the first time. A nanoscale effect that results in exceptionally high ionic conductivity at moderate temperatures is detected in films less than 60 nm thick. The conductivity increases continuously below this level and reaches 0.6 S/cm at 800°C for a 15 nm thick film, which represents the highest reported value for the YSZ system. The observed behavior is attributed to an increasingly significant contribution of the surface/interface conductivity with decreasing film thickness. These observations can have important implications for the development of nanostructured electrochemical devices with enhanced performance. & copy; 2004 The Electrochemical Society. All rights reserved.",

author = "Igor Kosacki and Rouleau, {Christopher M.} and Becher, {Paul F.} and James Bentley and Lowndes, {Douglas H.}",

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T1 - Surface/interface-related conductivity in nanometer thick YSZ films

AU - Kosacki, Igor

AU - Rouleau, Christopher M.

AU - Becher, Paul F.

AU - Bentley, James

AU - Lowndes, Douglas H.

PY - 2004

Y1 - 2004

N2 - Results of the electrical conductivity study of highly textured, ultrathin (15 nm) cubic yttria-stabilized zirconia (YSZ) thin films are presented for the first time. A nanoscale effect that results in exceptionally high ionic conductivity at moderate temperatures is detected in films less than 60 nm thick. The conductivity increases continuously below this level and reaches 0.6 S/cm at 800°C for a 15 nm thick film, which represents the highest reported value for the YSZ system. The observed behavior is attributed to an increasingly significant contribution of the surface/interface conductivity with decreasing film thickness. These observations can have important implications for the development of nanostructured electrochemical devices with enhanced performance. & copy; 2004 The Electrochemical Society. All rights reserved.

AB - Results of the electrical conductivity study of highly textured, ultrathin (15 nm) cubic yttria-stabilized zirconia (YSZ) thin films are presented for the first time. A nanoscale effect that results in exceptionally high ionic conductivity at moderate temperatures is detected in films less than 60 nm thick. The conductivity increases continuously below this level and reaches 0.6 S/cm at 800°C for a 15 nm thick film, which represents the highest reported value for the YSZ system. The observed behavior is attributed to an increasingly significant contribution of the surface/interface conductivity with decreasing film thickness. These observations can have important implications for the development of nanostructured electrochemical devices with enhanced performance. & copy; 2004 The Electrochemical Society. All rights reserved.

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JO - Electrochemical and Solid-State Letters

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ER -

Surface/interface-related conductivity in nanometer thick YSZ films

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