Abstract
Detector grade, charge compensated Cd1-xZnxTe (CZT) crystals were treated by mechanical polishing, chemical solution etching, and radio-frequency gold sputtering. The crystals and detectors were next studied using direct current (DC) photoconductivity and low-temperature photoluminescence (PL). The DC photocurrent was analyzed with a steady state continuity equation and the results were correlated with PL and gamma-ray detector performance tests. The dependence of the electron lifetime on the light intensity of the CZT detector was consistent with a Shockley-Read one-center model. It was found that the surface recombination velocities, the effective mobility-lifetime products, and gamma-ray performances of CZT crystals are modified dramatically by the choice of chemical etchant.
Original language | English |
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Pages (from-to) | 12-22 |
Number of pages | 11 |
Journal | Proceedings of SPIE - The International Society for Optical Engineering |
Volume | 4507 |
DOIs | |
State | Published - 2001 |
Externally published | Yes |
Event | Hard X-Ray and Gamma-Ray Detector Physics III - San Diego, CA, United States Duration: Jul 30 2001 → Aug 1 2001 |
Keywords
- CdZnTe
- Chemical etching
- DC photocurrent
- Detector performance
- Gamma-ray detectors
- Photoluminescence
- Surface recombination