Surface roughness characterization of various ceramic fibers using AFM and low-voltage SEM

K. L. More; E. Lara-Curzio; R. A. Lowden

Surface roughness characterization of various ceramic fibers using AFM and low-voltage SEM

K. L. More, E. Lara-Curzio, R. A. Lowden

Research output: Contribution to conference › Paper › peer-review

1 Scopus citations

Abstract

As part of an overall program relating fiber surface roughness to the interfacial shear stress, the surfaces of several ceramic fibers have been characterized qualitatively using a Hitachi S-4500 FEG SEM operated at low voltages and quantitatively using a Topometrix atomic force microscope (AFM). The fibers examined were primarily Nicalon, a SiC fiber, and Nextel, an aluminosilicate fiber.

Original language	English
Pages	1066-1067
Number of pages	2
State	Published - 1994
Event	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America - New Orleans, LA, USA Duration: Jul 31 1994 → Aug 5 1994

Conference

Conference	Proceedings of the 52nd Annual Meeting of the Microscopy Society of America
City	New Orleans, LA, USA
Period	07/31/94 → 08/5/94

Cite this

@conference{cfb8244940674aff86d05f4db7804f1c,

title = "Surface roughness characterization of various ceramic fibers using AFM and low-voltage SEM",

abstract = "As part of an overall program relating fiber surface roughness to the interfacial shear stress, the surfaces of several ceramic fibers have been characterized qualitatively using a Hitachi S-4500 FEG SEM operated at low voltages and quantitatively using a Topometrix atomic force microscope (AFM). The fibers examined were primarily Nicalon, a SiC fiber, and Nextel, an aluminosilicate fiber.",

author = "More, {K. L.} and E. Lara-Curzio and Lowden, {R. A.}",

year = "1994",

language = "English",

pages = "1066--1067",

note = "Proceedings of the 52nd Annual Meeting of the Microscopy Society of America ; Conference date: 31-07-1994 Through 05-08-1994",

}

TY - CONF

T1 - Surface roughness characterization of various ceramic fibers using AFM and low-voltage SEM

AU - More, K. L.

AU - Lara-Curzio, E.

AU - Lowden, R. A.

PY - 1994

Y1 - 1994

N2 - As part of an overall program relating fiber surface roughness to the interfacial shear stress, the surfaces of several ceramic fibers have been characterized qualitatively using a Hitachi S-4500 FEG SEM operated at low voltages and quantitatively using a Topometrix atomic force microscope (AFM). The fibers examined were primarily Nicalon, a SiC fiber, and Nextel, an aluminosilicate fiber.

AB - As part of an overall program relating fiber surface roughness to the interfacial shear stress, the surfaces of several ceramic fibers have been characterized qualitatively using a Hitachi S-4500 FEG SEM operated at low voltages and quantitatively using a Topometrix atomic force microscope (AFM). The fibers examined were primarily Nicalon, a SiC fiber, and Nextel, an aluminosilicate fiber.

UR - http://www.scopus.com/inward/record.url?scp=0028745685&partnerID=8YFLogxK

M3 - Paper

AN - SCOPUS:0028745685

SP - 1066

EP - 1067

T2 - Proceedings of the 52nd Annual Meeting of the Microscopy Society of America

Y2 - 31 July 1994 through 5 August 1994

ER -

Surface roughness characterization of various ceramic fibers using AFM and low-voltage SEM

Abstract

Conference

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