Abstract
Surface plasmons excited by a Nd:YAG (YAG, yttrium aluminum garnet) laser in an attenuated-total-reflection (ATR) geometry were used to desorb Al atoms from smooth Al films. The ejected Al atoms were ionized by a pulse-excimer laser and measured by time-of-flight mass spectroscopy. The desorption rate exhibits a sharp maximum at the surface-plasmon resonance angle. The experiment demonstrates that surface-plasmon-induced desorption can be accomplished on smooth surfaces. Since ATR excitation allows the use of a wide range of wavelengths, this method will be useful in the study of electronic desorption processes.
Original language | English |
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Pages (from-to) | 8012-8014 |
Number of pages | 3 |
Journal | Physical Review B |
Volume | 39 |
Issue number | 11 |
DOIs | |
State | Published - 1989 |