Surface excitations in liquid helium nanofilms

I. V. Kalinin; M. Koza; H. Lauter; V. V. Lauter-Pasyuk; A. V. Puchkov

doi:10.1134/S1063774507030224

Surface excitations in liquid helium nanofilms

I. V. Kalinin, M. Koza, H. Lauter, V. V. Lauter-Pasyuk, A. V. Puchkov

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1 Scopus citations

Abstract

The structural dynamic factor S(Q, ω) of liquid ⁴He has been measured by inelastic neutron scattering in films of different thickness at temperatures from 0.6 to 0.05 K. The measurements were performed on an IN6 spectrometer (Institut Laue-Langevin, France). Analysis of the obtained experimental data on S(Q, ω) made it possible to establish the main parameters of surface excitations arising in a helium film and their dependences on the film temperature and thickness. The measurements showed that surface excitations arise in a helium film at a thickness of about two to three atomic layers, and the film thickness plays a decisive role in the formation of surface excitations.

Original language	English
Pages (from-to)	466-470
Number of pages	5
Journal	Crystallography Reports
Volume	52
Issue number	3
DOIs	https://doi.org/10.1134/S1063774507030224
State	Published - May 2007
Externally published	Yes

Funding

This study was supported by the Russian Foundation for Basic Research, project no. 06-02-96302.

Funders	Funder number
Russian Foundation for Basic Research	06-02-96302

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title = "Surface excitations in liquid helium nanofilms",

abstract = "The structural dynamic factor S(Q, ω) of liquid 4He has been measured by inelastic neutron scattering in films of different thickness at temperatures from 0.6 to 0.05 K. The measurements were performed on an IN6 spectrometer (Institut Laue-Langevin, France). Analysis of the obtained experimental data on S(Q, ω) made it possible to establish the main parameters of surface excitations arising in a helium film and their dependences on the film temperature and thickness. The measurements showed that surface excitations arise in a helium film at a thickness of about two to three atomic layers, and the film thickness plays a decisive role in the formation of surface excitations.",

author = "Kalinin, {I. V.} and M. Koza and H. Lauter and Lauter-Pasyuk, {V. V.} and Puchkov, {A. V.}",

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AU - Kalinin, I. V.

AU - Koza, M.

AU - Lauter, H.

AU - Lauter-Pasyuk, V. V.

AU - Puchkov, A. V.

PY - 2007/5

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AB - The structural dynamic factor S(Q, ω) of liquid 4He has been measured by inelastic neutron scattering in films of different thickness at temperatures from 0.6 to 0.05 K. The measurements were performed on an IN6 spectrometer (Institut Laue-Langevin, France). Analysis of the obtained experimental data on S(Q, ω) made it possible to establish the main parameters of surface excitations arising in a helium film and their dependences on the film temperature and thickness. The measurements showed that surface excitations arise in a helium film at a thickness of about two to three atomic layers, and the film thickness plays a decisive role in the formation of surface excitations.

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Surface excitations in liquid helium nanofilms

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