Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer

Liran Zheng; Rajendra Prasad Kandula; Deepak Divan

doi:10.1109/APEC42165.2021.9487413

Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer

Liran Zheng, Rajendra Prasad Kandula, Deepak Divan

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Scopus citations

Abstract

Grounding related issues are critical for safe and reliable operation of solid-state transformer (SST) in medium-voltage (MV) utility applications. This paper presents the issue of additional device voltage stress due to grounding-path current for current-source soft-switching solid-state transformer (S4T). The S4T achieves single-stage AC-AC, AC-DC, or DC-DC conversion with full-range ZVS, derived from the current-source/flyback converters. However, the flyback operation means that the device voltage in the inactive reverse-blocking bridge can be influenced by parasitic current. A comprehensive parasitic model of a modular S4T (M-S4T) prototype is developed from direct measurements and datasheets. Using the developed parasitic model and equivalent circuits, the causes of the voltage stress are analyzed. A voltage-stress suppression scheme of connecting additional grounding capacitors to the transformer terminal and the input terminal is proposed. Robust parameter design guidelines of the proposed scheme are given. The effectiveness of the proposed scheme is verified experimentally with a M-S4T prototype based on SiC MOSFETs and diodes under single-module and stacked-module testing cases up to 1.6 kV peak.

Original language	English
Title of host publication	2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1674-1680
Number of pages	7
ISBN (Electronic)	9781728189499
DOIs	https://doi.org/10.1109/APEC42165.2021.9487413
State	Published - Jun 14 2021
Externally published	Yes
Event	36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021 - Virtual, Online, United States Duration: Jun 14 2021 → Jun 17 2021

Publication series

Name	Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

Conference

Conference	36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021
Country/Territory	United States
City	Virtual, Online
Period	06/14/21 → 06/17/21

Funding

This work is supported in part by ARPA-E under DE-AR0000899, and in part by Center for Distributed Energy, Georgia Institute of Technology. The information, data, or work presented herein was funded in part by the Advanced Research Projects Agency-Energy (ARPA-E), U.S. Department of Energy, under Award Number DE-AR0000899 in the CIRCUITS program monitored by Dr. Isik Kizilyalli, and in part by the Center for Distributed Energy, Georgia Tech. The views and opinions of authors expressed herein do not necessarily state or reflect those of the United States Government or any agency thereof.

Keywords

Common mode
Current-source converter (CSC)
Current-source inverter (CSI)
Ground leakage current
Input-series output-parallel (ISOP)
Power electronic transformer (PET)
Solid-state transformer (SST)
Zero-voltage switching (ZVS)

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/APEC42165.2021.9487413

Cite this

Zheng, L., Kandula, R. P., & Divan, D. (2021). Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer. In 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021 (pp. 1674-1680). (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEC42165.2021.9487413

Zheng, Liran ; Kandula, Rajendra Prasad ; Divan, Deepak. / Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer. 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021. Institute of Electrical and Electronics Engineers Inc., 2021. pp. 1674-1680 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).

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title = "Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer",

abstract = "Grounding related issues are critical for safe and reliable operation of solid-state transformer (SST) in medium-voltage (MV) utility applications. This paper presents the issue of additional device voltage stress due to grounding-path current for current-source soft-switching solid-state transformer (S4T). The S4T achieves single-stage AC-AC, AC-DC, or DC-DC conversion with full-range ZVS, derived from the current-source/flyback converters. However, the flyback operation means that the device voltage in the inactive reverse-blocking bridge can be influenced by parasitic current. A comprehensive parasitic model of a modular S4T (M-S4T) prototype is developed from direct measurements and datasheets. Using the developed parasitic model and equivalent circuits, the causes of the voltage stress are analyzed. A voltage-stress suppression scheme of connecting additional grounding capacitors to the transformer terminal and the input terminal is proposed. Robust parameter design guidelines of the proposed scheme are given. The effectiveness of the proposed scheme is verified experimentally with a M-S4T prototype based on SiC MOSFETs and diodes under single-module and stacked-module testing cases up to 1.6 kV peak.",

keywords = "Common mode, Current-source converter (CSC), Current-source inverter (CSI), Ground leakage current, Input-series output-parallel (ISOP), Power electronic transformer (PET), Solid-state transformer (SST), Zero-voltage switching (ZVS)",

author = "Liran Zheng and Kandula, {Rajendra Prasad} and Deepak Divan",

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Zheng, L, Kandula, RP & Divan, D 2021, Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer. in 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021. Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC, Institute of Electrical and Electronics Engineers Inc., pp. 1674-1680, 36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021, Virtual, Online, United States, 06/14/21. https://doi.org/10.1109/APEC42165.2021.9487413

Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer. / Zheng, Liran; Kandula, Rajendra Prasad; Divan, Deepak.
2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021. Institute of Electrical and Electronics Engineers Inc., 2021. p. 1674-1680 (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer

AU - Zheng, Liran

AU - Kandula, Rajendra Prasad

AU - Divan, Deepak

PY - 2021/6/14

Y1 - 2021/6/14

N2 - Grounding related issues are critical for safe and reliable operation of solid-state transformer (SST) in medium-voltage (MV) utility applications. This paper presents the issue of additional device voltage stress due to grounding-path current for current-source soft-switching solid-state transformer (S4T). The S4T achieves single-stage AC-AC, AC-DC, or DC-DC conversion with full-range ZVS, derived from the current-source/flyback converters. However, the flyback operation means that the device voltage in the inactive reverse-blocking bridge can be influenced by parasitic current. A comprehensive parasitic model of a modular S4T (M-S4T) prototype is developed from direct measurements and datasheets. Using the developed parasitic model and equivalent circuits, the causes of the voltage stress are analyzed. A voltage-stress suppression scheme of connecting additional grounding capacitors to the transformer terminal and the input terminal is proposed. Robust parameter design guidelines of the proposed scheme are given. The effectiveness of the proposed scheme is verified experimentally with a M-S4T prototype based on SiC MOSFETs and diodes under single-module and stacked-module testing cases up to 1.6 kV peak.

AB - Grounding related issues are critical for safe and reliable operation of solid-state transformer (SST) in medium-voltage (MV) utility applications. This paper presents the issue of additional device voltage stress due to grounding-path current for current-source soft-switching solid-state transformer (S4T). The S4T achieves single-stage AC-AC, AC-DC, or DC-DC conversion with full-range ZVS, derived from the current-source/flyback converters. However, the flyback operation means that the device voltage in the inactive reverse-blocking bridge can be influenced by parasitic current. A comprehensive parasitic model of a modular S4T (M-S4T) prototype is developed from direct measurements and datasheets. Using the developed parasitic model and equivalent circuits, the causes of the voltage stress are analyzed. A voltage-stress suppression scheme of connecting additional grounding capacitors to the transformer terminal and the input terminal is proposed. Robust parameter design guidelines of the proposed scheme are given. The effectiveness of the proposed scheme is verified experimentally with a M-S4T prototype based on SiC MOSFETs and diodes under single-module and stacked-module testing cases up to 1.6 kV peak.

KW - Common mode

KW - Current-source converter (CSC)

KW - Current-source inverter (CSI)

KW - Ground leakage current

KW - Input-series output-parallel (ISOP)

KW - Power electronic transformer (PET)

KW - Solid-state transformer (SST)

KW - Zero-voltage switching (ZVS)

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DO - 10.1109/APEC42165.2021.9487413

M3 - Conference contribution

AN - SCOPUS:85115708353

T3 - Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC

SP - 1674

EP - 1680

BT - 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 36th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2021

Y2 - 14 June 2021 through 17 June 2021

ER -

Zheng L, Kandula RP, Divan D. Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer. In 2021 IEEE Applied Power Electronics Conference and Exposition, APEC 2021. Institute of Electrical and Electronics Engineers Inc. 2021. p. 1674-1680. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC). doi: 10.1109/APEC42165.2021.9487413

Suppression of device voltage stress from ground leakage current for soft-switching solid-state transformer

Abstract

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Funding

Keywords

UN SDGs

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