Abstract
Mixed-cation mixed-halide perovskite compositions are essential for achieving the required bandgaps for high-efficiency multijunction photovoltaics, yet their stability remains limited by interfacial defects, phase segregation, and degradation. Here, we introduce spinel oxides as a new family of lattice-matched substrates that enable crystalline, phase-pure, compositionally-uniform, bromide-rich perovskite film growth. The effect of spinel oxides is two-fold: reducing defects at the bottom interface by templating film growth and inducing beneficial compressive strain through mismatch-dependent substrate-perovskite lattice coupling. Spinel oxide substrates facilitate growth of highly crystalline films and eliminate detrimental secondary phases across thicknesses. Using grazing incidence X-ray diffraction, X-ray fluorescence, cathodoluminescence–scanning electron microscopy, cryogenic photoluminescence, and density functional theory, we reveal that Mg-halide bonds at the bottom interface induce lattice mismatch-dependent compressive strain that suppresses halide segregation and further reduces defect formation. In addition, films grown on spinel oxides maintain over 87% of the perovskite phase after 12 h under 100% relative humidity, as monitored by in situ grazing incidence wide-angle X-ray scattering (GIWAXS), compared to less than 70% for control samples. This work extends lattice matching from vapor-deposited epitaxial semiconductors to solution-processed halide perovskites to establish a broadly applicable strategy for defect suppression, phase homogenization, and long-term stability. Based on the fundamental science explored here, we set the stage for the development of lattice-matched spinel oxide charge transport layers to be integrated into perovskite solar cells and other optoelectronic devices.
| Original language | English |
|---|---|
| Pages (from-to) | 26076-26091 |
| Number of pages | 16 |
| Journal | Journal of the American Chemical Society |
| Volume | 148 |
| Issue number | 25 |
| DOIs | |
| State | Published - Jul 1 2026 |
Funding
This work was performed in part at the Georgia Tech Institute for Matter and Systems, a member of the National Nanotechnology Coordinated Infrastructure (NNCI), which is supported by the National Science Foundation (ECCS-2025462). D.K.L. acknowledges the Department of Education Graduate Assistance in Areas of National Need (GAANN) program at the Georgia Institute of Technology (Award #PP200A240071). This research used the CMS 11-BM beamline of the National Synchrotron Light Source II, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by the Brookhaven National Laboratory under Contract DE-SC0012704. CL microscopy was supported by the Center for Nanophase Materials Sciences (CNMS), which is a U.S. Department of Energy, Office of Science User Facility at Oak Ridge National Laboratory. D.K.L. thanks the National Science Foundation Graduate Research Fellowship under Grant No. DGE-2039655 for supporting this work. Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s) and do not necessarily reflect the views of the National Science Foundation. This research used resources of the National Energy Research Scientific Computing Center, a DOE Office of Science User Facility supported by the Office of Science of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231 using NERSC award BES-ERCAP0032102. This research was performed on APS beam time award (DOI:10.46936/APS-188873/60013377) from the Advanced Photon Source, a U.S. Department of Energy (DOE) Office of Science User Facility operated for the DOE Office of Science by Argonne National Laboratory under Contract No. DE-AC02-06CH11357. J.P.C.B., S.C., G.H., M.G.D., A.C.M., and J.L. were supported by the U.S. National Science Foundation Science and Technology Center (STC) for Integration of Modern Optoelectronic Materials on Demand (IMOD) under Cooperative Agreement No. DMR-2019444 for calculations and materials characterization. D.K.L. thanks Sanggyun Kim for XPS measurements and David Tavakoli for generous GIXRD support.
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