Abstract
Bulk nucleation of crystalline Si at a supercooling of 505 K was observed following pulsedlaser-induced melting of thin films. If the nucleation was homogeneous, the estimated nucleation rate of 1029 events/m3 s implies a liquid-Si-crystalline-Si interfacial energy of 0.34 0.02 J/m2. In addition, observation of crystalline nucleation bounds the interface energy between amorphous Si and liquid Si to be > 0.20 J/m2. This laser melting technique is applicable to nucleation studies in a wide variety of materials.
| Original language | English |
|---|---|
| Pages (from-to) | 2519-2522 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 60 |
| Issue number | 24 |
| DOIs | |
| State | Published - 1988 |
| Externally published | Yes |