Summary of "IAEA intercomparison of IBA software"

  • N. P. Barradas
  • , K. Arstila
  • , G. Battistig
  • , M. Bianconi
  • , N. Dytlewski
  • , C. Jeynes
  • , E. Kótai
  • , G. Lulli
  • , M. Mayer
  • , E. Rauhala
  • , E. Szilágyi
  • , M. Thompson

Research output: Contribution to journalArticlepeer-review

67 Scopus citations

Abstract

The International Atomic Energy Agency has sponsored a formal intercomparison exercise for the seven depth profiling ion beam analysis codes, which are: GISA, RUMP, RBX, DEPTH, DataFurnace, SIMNRA and MCERD. This intercomparison is published in Nucl. Instr. and Meth. B [N.P. Barradas, K. Arstila, G. Battistig, M. Bianconi, N. Dytlewski, C. Jeynes, E. Kótai, G. Lulli, M. Mayer, E. Rauhala, E. Szilágyi, M. Thompson, Nucl. Instr. and Meth. B 262 (2007) 281-303] and summarised here. The codes implement all known physical effects and they are all evaluated. We demonstrate that there is agreement between codes often better than 0.1%; and also detailed agreement with real spectra, showing in particular that the SRIM 2003 stopping powers for Si are correct to 0.6% for 1.5 MeV He. For the case of heavy ion elastic recoil detection (HI-ERD) the single scattering codes performed poorly for scattered particles, although recoiled particles were calculated correctly.

Original languageEnglish
Pages (from-to)1338-1342
Number of pages5
JournalNuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume266
Issue number8
DOIs
StatePublished - Apr 2008
Externally publishedYes

Funding

We would like to thank the IAEA for supporting this intercomparison exercise, Dr. Alexander Gurbich for providing some scattering cross-sections. Work is partially supported by the Hungarian OTKA Grant No.: T 046238 and the UK EPSRC Grant GR/R50097.

Keywords

  • Channelling
  • Computer software
  • Data analysis
  • EBS
  • ERDA
  • Glancing geometry
  • Ion beam analysis
  • Monte Carlo
  • Multiple scattering
  • NDF
  • NRA
  • RBS
  • Resonance
  • Roughness
  • Silicon
  • Simulation
  • Stopping power
  • Straggling

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