Subsurface profile refinement for neutron specular reflectivity (Invited Paper)

John F. Ankner; Charles F. Majkrzak

Subsurface profile refinement for neutron specular reflectivity (Invited Paper)

John F. Ankner, Charles F. Majkrzak

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

101 Scopus citations

Abstract

The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.

Original language	English
Title of host publication	Proceedings of SPIE - The International Society for Optical Engineering
Publisher	Publ by Int Soc for Optical Engineering
Pages	260-269
Number of pages	10
ISBN (Print)	0819409111
State	Published - 1992
Externally published	Yes
Event	Neutron Optical Devices and Applications - San Diego, CA, USA Duration: Jul 22 1992 → Jul 24 1992

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	1738
ISSN (Print)	0277-786X

Conference

Conference	Neutron Optical Devices and Applications
City	San Diego, CA, USA
Period	07/22/92 → 07/24/92

Cite this

@inproceedings{1bbc7cabdba142bda0b05f34c703c83a,

title = "Subsurface profile refinement for neutron specular reflectivity (Invited Paper)",

abstract = "The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.",

author = "Ankner, {John F.} and Majkrzak, {Charles F.}",

year = "1992",

language = "English",

isbn = "0819409111",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "Publ by Int Soc for Optical Engineering",

pages = "260--269",

booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",

note = "Neutron Optical Devices and Applications ; Conference date: 22-07-1992 Through 24-07-1992",

}

Ankner, JF & Majkrzak, CF 1992, Subsurface profile refinement for neutron specular reflectivity (Invited Paper). in Proceedings of SPIE - The International Society for Optical Engineering. Proceedings of SPIE - The International Society for Optical Engineering, vol. 1738, Publ by Int Soc for Optical Engineering, pp. 260-269, Neutron Optical Devices and Applications, San Diego, CA, USA, 07/22/92.

Subsurface profile refinement for neutron specular reflectivity (Invited Paper). / Ankner, John F.; Majkrzak, Charles F.
Proceedings of SPIE - The International Society for Optical Engineering. Publ by Int Soc for Optical Engineering, 1992. p. 260-269 (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 1738).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Subsurface profile refinement for neutron specular reflectivity (Invited Paper)

AU - Ankner, John F.

AU - Majkrzak, Charles F.

PY - 1992

Y1 - 1992

N2 - The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.

AB - The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.

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M3 - Conference contribution

AN - SCOPUS:0027001134

SN - 0819409111

T3 - Proceedings of SPIE - The International Society for Optical Engineering

SP - 260

EP - 269

BT - Proceedings of SPIE - The International Society for Optical Engineering

PB - Publ by Int Soc for Optical Engineering

T2 - Neutron Optical Devices and Applications

Y2 - 22 July 1992 through 24 July 1992

ER -

Subsurface profile refinement for neutron specular reflectivity (Invited Paper)

Abstract

Publication series

Conference

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